Search Results - "Gehlhausen, M.A."

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  1. 1
    A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment

    A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment by Pease, R.L., Cohn, L.M., Fleetwood, D.M., Gehlhausen, M.A., Turflinger, T.L., Brown, D.B., Johnston, A.H.

    Published in IEEE transactions on nuclear science (01-12-1997)
    “…A hardness assurance test approach has been developed for bipolar linear circuits and devices in space. It consists of an initial test for dose rate…”
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  2. 2
    Characterization of a fully resonant, 1-MHz, 25-Watt, DC/DC converter fabricated in a rad-hard BiCMOS/high-voltage process

    Characterization of a fully resonant, 1-MHz, 25-Watt, DC/DC converter fabricated in a rad-hard BiCMOS/high-voltage process by Titus, J.L., Gehlhausen, M.A., Desko, J.C., Nguyen, T.T., Shibib, M.A., Hollenbach, K.E., Roberts, D.J.

    Published in IEEE transactions on nuclear science (01-12-1995)
    “…This paper presents the characterization of a DC/DC converter prototype when its power integrated circuit (PIC) chip is exposed to total dose, dose rate,…”
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