Search Results - "Gasquet, H"

Silicon nanocrystal non-volatile memory for embedded memory scaling by Steimle, R.F., Muralidhar, R., Rao, R., Sadd, M., Swift, C.T., Yater, J., Hradsky, B., Straub, S., Gasquet, H., Vishnubhotla, L., Prinz, E.J., Merchant, T., Acred, B., Chang, K., White, B.E.

“…In this paper, we present key features of silicon nanocrystal memory technology. This technology is an attractive candidate for scaling of embedded…”
Get full text

Strong nonlocal effects in a tokamak perturbative transport experiment by Gentle, KW, Rowan, WL, Bravenec, RV, Cima, G, Crowley, TP, Gasquet, H, Hallock, GA, Heard, J, Ouroua, A, Phillips, PE, Ross, DW, Schoch, PM, Watts, C

Get full text

Influence of silicon nanocrystal size and density on the performance of non-volatile memory arrays by Rao, R.A., Gasquet, H.P., Steimle, R.F., Rinkenberger, G., Straub, S., Muralidhar, R., Anderson, S.G.H., Yater, J.A., Ledezma, J.C., Hamilton, J., Acred, B., Swift, C.T., Hradsky, B., Peschke, J., Sadd, M., Prinz, E.J., Chang, K.M., White, B.E.

“…Silicon nanocrystal memories offer opportunities for voltage scaling and process simplification for embedded non-volatile memories. While electrically isolated…”
Get full text

Characteristics of equilibrium and perturbed transport coefficients in tokamaks by Gentle, K W, Cima, G, Gasquet, H, Hallock, G A, Phillips, P E, Rowan, W L, Watts, C, Gehre, O, Team, the ASDEX-U

Get full text

Highly Optimized Nanocrystal-Based Split Gate Flash for High Performance and Low Power Microcontroller Applications by Yater, J, Hong, C, Kang, S.-T, Kolar, D, Min, B, Shen, J, Chindalore, G, Loiko, K, Winstead, B, Williams, S, Gasquet, H, Suhail, M, Broeker, K, Lepore, E, Hardell, A, Malloch, W, Syzdek, R, Chen, Y, Ju, Y, Kumarasamy, S, Liu, H, Lei, L, Indajang, B

“…We show a 90nm nanocrystal-based split gate embedded flash memory that is able to meet the speed, endurance and reliability requirements for 32-bit…”
Get full text

First-ever high-performance, low-power 32-bit microcontrollers with embedded nanocrystal flash and enhanced EEPROM memories by Yater, J., Kang, S.-T, Hong, C. M., Min, B., Kolar, D., Loiko, K., Shen, J., Winstead, B., Gasquet, H., Mohammed, S., Hardell, A., Malloch, W., Cook, B., Syzdek, R., Jarrar, A., Feddeler, J., Baker, K., Chang, K. M., Herrin, S., Parks, R., Chindalore, G.

“…We present the first-ever commercially available microcontroller families built with innovative split-gate based NOR flash memory that uses silicon…”
Get full text

Embedded split-gate flash memory with silicon nanocrystals for 90nm and beyond by Chindalore, G., Yater, J., Gasquet, H., Suhail, M., Sung-Taeg Kang, Cheong Min Hong, Ellis, N., Rinkenberger, G., Shen, J., Herrick, M., Malloch, W., Syzdek, R., Baker, K., Ko-Min Chang

“…We present a split-gate based NOR flash memory array with silicon nanocrystals as the storage medium. 128 KB memory arrays have been evaluated with this…”
Get full text

High Performance Nanocrystal Based Embedded Flash Microcontrollers with Exceptional Endurance and Nanocrystal Scaling Capability by Sung-Taeg Kang, Winstead, B., Yater, J., Suhail, M., Zhang, G., Hong, C.-M, Gasquet, H., Kolar, D., Shen, J., Min, B., Loiko, K., Hardell, A., LePore, E., Parks, R., Syzdek, R., Williams, S., Malloch, W., Chindalore, G., Chen, Y., Shao, Y., Huajun, L., Louis, L., Chwa, S.

“…In this paper, we present the first-ever commercially available embedded Microcontrollers built on 90nm-node with silicon nanocrystal memories that has…”
Get full text

16Mb Split Gate Flash Memory with Improved Process Window by Yater, J., Suhail, M., Kang, S.-T., Shen, J., Hong, C., Merchant, T., Gasquet, R.R.H., Loiko, K., Winstead, B., Williams, S., Rossow, M., Malloch, W., Syzdek, R., Chindalore, G.

“…This paper reports on recent bitcell optimizations that improve drive current and program performance. The 16 Mb and 32 Mb array results are best to-date for…”
Get full text

Reliability Study of Split Gate Silicon Nanocrystal Flash EEPROM by Cheong Min Hong, Yater, J., Sung-Taeg Kang, Gasquet, H., Chindalore, G.

“…In this paper, we present a measurement based on biased data retention to determine the direction of charge loss. Top oxide and bottom oxide thickness can be…”
Get full text

Si Nanocrystal Split Gate Technology Optimization for High Performance and Reliable Embedded Microcontroller Applications by Sung-Taeg Kang, Yater, J., CheongMin Hong, Shen, J., Ellis, N., Herrick, M., Gasquet, H., Malloch, W., Chindalore, G.

“…In this paper, the authors present the performance characteristics of such a silicon nanocrystal split gate bitcell and report an optimal bitcell process and…”
Get full text

The Channel 6 Color Beat-What can be Done About it? by Gasquet, Hector L.

“…The performance of a V.H.F. tuner under strong signal reception is limited by the nonlinear effects that take place either in the R.F. or the mixer stages…”
Get full text