Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment

We are developing n +-in-p, p-bulk and n-readout, microstrip sensors as a non-inverting radiation hard silicon detector for the ATLAS Tracker Upgrade at the super LHC experiment. The surface radiation damages of the sensors fabricated by Hamamatsu Photonics are characterized on the interstrip capaci...

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Published in:	Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 636; no. 1; pp. S111 - S117
Main Authors:	Lindgren, S., Affolder, A.A., Allport, P.P., Bates, R., Betancourt, C., Bohm, J., Brown, H., Buttar, C., Carter, J.R., Casse, G., Chen, H., Chilingarov, A., Cindro, V., Clark, A., Dawson, N., DeWilde, B., Doherty, F., Dolezal, Z., Eklund, L., Fadeyev, V., Ferrèrre, D., Fox, H., French, R., García, C., Gerling, M., Gonzalez Sevilla, S., Gorelov, I., Greenall, A., Grillo, A.A., Hamasaki, N., Hara, K., Hatano, H., Hoeferkamp, M., Hommels, L.B.A., Ikegami, Y., Jakobs, K., Kierstead, J., Kodys, P., Köhler, M., Kohriki, T., Kramberger, G., Lacasta, C., Li, Z., Lynn, D., Maddock, P., Mandić, I., Martinez-McKinney, F., Garcia, S.Martíi, Maunu, R., McCarthy, R., Metcalfe, J., Mikestikova, M., Mikuž, M., Miñano, M., Mitsui, S., O’Shea, V., Parzefall, U., Sadrozinski, H.F.-W., Schamberger, D., Seiden, A., Terada, S., Paganis, S., Robinson, D., Puldon, D., Sattari, S., Seidel, S., Toms, K., Tsionou, D., Unno, Y., Von Wilpert, J., Wormald, M., Wright, J., Yamada, M.
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 21-04-2011
Subjects:	Charge collection p-Bulk silicon Punch-through voltage Surface damage Charge collection Punch-through voltage p-Bulk silicon Surface damage
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