Search Results - "Gaquiere, Ch"

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  1. 1

    Room-temperature terahertz emission from nanometer field-effect transistors by Dyakonova, N., El Fatimy, A., Łusakowski, J., Knap, W., Dyakonov, M. I., Poisson, M.-A., Morvan, E., Bollaert, S., Shchepetov, A., Roelens, Y., Gaquiere, Ch, Theron, D., Cappy, A.

    Published in Applied physics letters (03-04-2006)
    “…Room-temperature generation of terahertz radiation in nanometer gate length InAlAs∕InGaAs and AlGaN∕GaN high-mobility transistors is reported. A well-defined…”
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    Journal Article
  2. 2

    Room-temperature terahertz emission from nanometerfield-effect transistors by Dyakonova, N., El Fatimy, A., Łusakowski, J., Knap, W., Dyakonov, M. I., Poisson, M.-A., Morvan, E., Bollaert, S., Shchepetov, A., Roelens, Y., Gaquiere, Ch, Theron, D., Cappy, A.

    Published in Applied physics letters (04-04-2006)
    “…Room-temperature generation of terahertz radiation in nanometer gate length In Al As ∕ In Ga As and Al Ga N ∕ Ga N high-mobility transistors is reported. A…”
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    Journal Article
  3. 3

    Role of the gate-to-drain distance in the performance of the normally-off InAlN/GaN HEMTs by Kuzmik, J, Ostermaier, O, Pozzovivo, G, Basnar, B, Schrenk, W, Carlin, J, Gonschorek, M, Feltin, E, Grandjean, N, Douvry, Y, Gaquière, Ch, De Jaeger, J, Strasser, G, Pogany, D, Gornik, E

    “…We correlate dc maximal drain current I DSmax , pulsed output characteristics, rf small-signal and breakdown performance of normally-off InAlN/GaN HEMTs with…”
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    Conference Proceeding
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