Search Results - "GORGOI, M"

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  1. 1

    Comparing anode and cathode electrode/electrolyte interface composition and morphology using soft and hard X-ray photoelectron spectroscopy by Malmgren, S., Ciosek, K., Hahlin, M., Gustafsson, T., Gorgoi, M., Rensmo, H., Edström, K.

    Published in Electrochimica acta (01-05-2013)
    “…•Depth profiling of the full anode SEI and cathode SPI was performed using hard and soft X-ray PES.•In the innermost SEI, compounds like Li2O and lithium…”
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  2. 2

    Experimental indication for band gap widening of chalcopyrite solar cell absorbers after potassium fluoride treatment by Pistor, P., Greiner, D., Kaufmann, C. A., Brunken, S., Gorgoi, M., Steigert, A., Calvet, W., Lauermann, I., Klenk, R., Unold, T., Lux-Steiner, M.-C.

    Published in Applied physics letters (11-08-2014)
    “…The implementation of potassium fluoride treatments as a doping and surface modification procedure in chalcopyrite absorber preparation has recently gained…”
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  3. 3

    Full depth profile of passive films on 316L stainless steel based on high resolution HAXPES in combination with ARXPS by Fredriksson, W., Malmgren, S., Gustafsson, T., Gorgoi, M., Edström, K.

    Published in Applied surface science (15-05-2012)
    “…► Depth profiles of passive films and the chemical content underneath the film on stainless steel by combining ARXPS and HAXPES. ► Nickel is enriched…”
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  4. 4

    Surface modification of iron oxides by ion bombardment – Comparing depth profiling by HAXPES and Ar ion sputtering by Fondell, M., Gorgoi, M., Boman, M., Lindblad, A.

    “…•Only HAXPES taken with 3keV photons sees deep enough below the surface layer oxyhydride to reveal the correct sample composition in the bulk.•Sputtering, even…”
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  5. 5

    Profiling the interface electron gas of LaAlO3/SrTiO3 heterostructures with hard x-ray photoelectron spectroscopy by Sing, M, Berner, G, Goss, K, Müller, A, Ruff, A, Wetscherek, A, Thiel, S, Mannhart, J, Pauli, S A, Schneider, C W, Willmott, P R, Gorgoi, M, Schäfers, F, Claessen, R

    Published in Physical review letters (01-05-2009)
    “…The conducting interface of LaAlO3/SrTiO3 heterostructures has been studied by hard x-ray photoelectron spectroscopy. From the Ti 2p signal and its angle…”
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    Interface Engineering to Create a Strong Spin Filter Contact to Silicon by Caspers, C., Gloskovskii, A., Gorgoi, M., Besson, C., Luysberg, M., Rushchanskii, K. Z., Ležaić, M., Fadley, C. S., Drube, W., Müller, M.

    Published in Scientific reports (15-03-2016)
    “…Integrating epitaxial and ferromagnetic Europium Oxide (EuO) directly on silicon is a perfect route to enrich silicon nanotechnology with spin filter…”
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  8. 8

    Single bunch X-ray pulses on demand from a multi-bunch synchrotron radiation source by Holldack, K., Ovsyannikov, R., Kuske, P., Müller, R., Schälicke, A., Scheer, M., Gorgoi, M., Kühn, D., Leitner, T., Svensson, S., Mårtensson, N., Föhlisch, A.

    Published in Nature communications (30-05-2014)
    “…Synchrotron radiation facilities routinely operate in a multi-bunch regime, but applications relying on time-of-flight schemes require single bunch operation…”
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  9. 9

    On the origin of a third spectral component of C1s XPS-spectra for nc-TiC/a-C nanocomposite thin films by Lewin, E., Persson, P.O.Å., Lattemann, M., Stüber, M., Gorgoi, M., Sandell, A., Ziebert, C., Schäfers, F., Braun, W., Halbritter, J., Ulrich, S., Eberhardt, W., Hultman, L., Siegbahn, H., Svensson, S., Jansson, U.

    Published in Surface & coatings technology (25-04-2008)
    “…X-ray photoelectron spectroscopy (XPS) spectra of sputter-etched nc-TiC/a-C nanocomposite thin films published in literature show an extra feature of unknown…”
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  10. 10

    Two dimensional band structure mapping of organic single crystals using the new generation electron energy analyzer ARTOF by Vollmer, A., Ovsyannikov, R., Gorgoi, M., Krause, S., Oehzelt, M., Lindblad, A., Mårtensson, N., Svensson, S., Karlsson, P., Lundvuist, M., Schmeiler, T., Pflaum, J., Koch, N.

    “…► A novel type of photoemission detector is introduced: the Angle Resolved Time Of Flight electron energy analyzer (ARTOF). ► It enables electronic band…”
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    Investigation of Cu-poor and Cu-rich Cu(In,Ga)Se2/CdS interfaces using hard X-ray photoelectron spectroscopy by Ümsür, B., Calvet, W., Höpfner, B., Steigert, A., Lauermann, I., Gorgoi, M., Prietzel, K., Navirian, H.A., Kaufmann, C.A., Unold, T., Lux-Steiner, M. Ch

    Published in Thin solid films (01-05-2015)
    “…Cu-poor and Cu-rich Cu(In,Ga)Se2 (CIGSe) absorbers were used as substrates for the chemical bath deposition of ultrathin CdS buffer layers in the thickness…”
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  13. 13

    Phase control of iron oxides grown in nano-scale structures on FTO and Si(100): Hematite, maghemite and magnetite by Fondell, M., Johansson, F., Gorgoi, M., von Fieandt, L., Boman, M., Lindblad, A.

    Published in Vacuum (01-07-2015)
    “…We demonstrate that iron oxide in the form of hematite, suitable as absorption material in photoelectrochemical cells, can be produced by pulsed chemical…”
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  15. 15

    Relative sub-shell photoionization cross-sections of nickel metal determined by hard X-ray high kinetic energy photoemission by Gorgoi, M., Schäfers, F., Svensson, S., Mårtensson, N.

    “…► We determined for the first time photoionization cross sections of Ni 3s and 3p. ► The experimental cross sections were measured within 2–9keV excitation…”
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  16. 16

    The silicon/zinc oxide interface in amorphous silicon-based thin-film solar cells: Understanding an empirically optimized contact by Gerlach, D., Wilks, R. G., Wippler, D., Wimmer, M., Lozac'h, M., Félix, R., Mück, A., Meier, M., Ueda, S., Yoshikawa, H., Gorgoi, M., Lips, K., Rech, B., Sumiya, M., Hüpkes, J., Kobayashi, K., Bär, M.

    Published in Applied physics letters (08-07-2013)
    “…The electronic structure of the interface between the boron-doped oxygenated amorphous silicon “window layer” (a-SiOx:H(B)) and aluminum-doped zinc oxide…”
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  17. 17

    Chemical interaction at the buried silicon/zinc oxide thin-film solar cell interface as revealed by hard X-ray photoelectron spectroscopy by Wimmer, M., Gerlach, D., Wilks, R.G., Scherf, S., Félix, R., Lupulescu, C., Ruske, F., Schondelmaier, G., Lips, K., Hüpkes, J., Gorgoi, M., Eberhardt, W., Rech, B., Bär, M.

    “…•We used HAXPES to identify chemical interactions at the buried silicon/aluminum-doped zinc oxide thin-film solar cell interface.•The results indicate a…”
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  18. 18

    “Band bending” in copper phthalocyanine on hydrogen-passivated Si(111) by Gorgoi, M., Zahn, D.R.T.

    Published in Organic electronics (01-08-2005)
    “…Ultraviolet photoemission spectroscopy (UPS) and inverse photoemission spectroscopy (IPES) were employed to study the electronic density of states of copper…”
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  19. 19

    Fe3O4 on ZnO: A spectroscopic study of film and interface properties by Mueller, A, Ruff, A, Paul, M, Wetscherek, A, Berner, G, Bauer, U, Praetorius, C, Fauth, K, Przybylski, M, Gorgoi, M, Sing, M, Claessen, R

    Published in Thin solid films (31-10-2011)
    “…Magnetite (Fe3O4) thin films have been grown epitaxially on zinc oxide (ZnO) substrates, using reactive molecular beam epitaxy. The film quality was found to…”
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  20. 20

    X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures by Filatova, E.O., Kozhevnikov, I.V., Sokolov, A.A., Yegorova, Yu V., Konashuk, A.S., Vilkov, O.Yu, Schaefers, F., Gorgoi, M., Shulakov, A.S.

    Published in Microelectronic engineering (01-09-2013)
    “…[Display omitted] •Air-exposed Sr-rich–SrTiO3/B/Si-ALD systems (B: SiO2, Si3N4 and HfO2) are studied.•Surfaces of all the films are carbonate-enriched by SrCO3…”
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