Search Results - "GILLEN, Greg"

Test Sample for the Spatially Resolved Quantification of Illicit Drugs on Fingerprints Using Imaging Mass Spectrometry by Muramoto, Shin, Forbes, Thomas P, van Asten, Arian C, Gillen, Greg

“…A novel test sample for the spatially resolved quantification of illicit drugs on the surface of a fingerprint using time-of-flight secondary ion mass…”
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Biomimetic Sniffing Improves the Detection Performance of a 3D Printed Nose of a Dog and a Commercial Trace Vapor Detector by Staymates, Matthew E., MacCrehan, William A., Staymates, Jessica L., Kunz, Roderick R., Mendum, Thomas, Ong, Ta-Hsuan, Geurtsen, Geoffrey, Gillen, Greg J., Craven, Brent A.

“…Unlike current chemical trace detection technology, dogs actively sniff to acquire an odor sample. Flow visualization experiments with an anatomically-similar…”
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Nanoporous Silicon Combustion: Observation of Shock Wave and Flame Synthesis of Nanoparticle Silica by Becker, Collin R, Gillen, Greg J, Staymates, Matthew E, Stoldt, Conrad R

“…The persistent hydrogen termination present in nanoporous silicon (nPS) is unique compared to other forms of nanoscale silicon (Si) which typically readily…”
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Particle Fabrication Using Inkjet Printing onto Hydrophobic Surfaces for Optimization and Calibration of Trace Contraband Detection Sensors by Gillen, Greg, Najarro, Marcela, Wight, Scott, Walker, Marlon, Verkouteren, Jennifer, Windsor, Eric, Barr, Tim, Staymates, Matthew, Urbas, Aaron

“…A method has been developed to fabricate patterned arrays of micrometer-sized monodisperse solid particles of ammonium nitrate on hydrophobic silicon surfaces…”
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Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics by Mahoney, Christine M, Fahey, Albert J, Gillen, Greg

“…Secondary ion mass spectrometry employing an SF5 + polyatomic primary ion source was used to depth profile poly(methyl methacrylate) (PMMA) at a series of…”
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Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry by Mahoney, Christine M, Roberson, Sonya V, Gillen, Greg

“…The feasibility of using cluster secondary ion mass spectrometry for depth profiling of drug delivery systems is explored. The behavior of various…”
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Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry by Gillen, Greg, Roberson, Sonya

“…Organic vapor deposited thin films of pure biomolecules, polymer films and biomolecules dispersed in gelatin and biological tissue have been analyzed in a…”
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Depth profiling using C60+ SIMS : Deposition and topography development during bombardment of silicon by GILLEN, Greg, BATTEAS, James, MICHAELS, Chris A, CHI, Peter, SMALL, John, WINDSOR, Eric, FAHEY, Albert, VERKOUTEREN, Jennifer, KIM, K. J

“…A C60+ primary ion source has been coupled to an ion microscope secondary ion mass spectrometry (SIMS) instrument to examine sputtering of silicon with an…”
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Secondary ion mass spectrometry using cluster primary ion beams by Gillen, Greg, Fahey, Albert

“…We have a developed a capability for conducting cluster secondary ion mass spectrometry (SIMS) experiments on commercially available SIMS instrumentation. This…”
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Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS) by Mahoney, Christine M., Fahey, Albert J., Gillen, Greg, Xu, Chang, Batteas, James D.

“…Secondary ion mass spectrometry (SIMS) employing an SF 5 + polyatomic primary ion source was used to depth profile through poly(methylmethacrylate) (PMMA),…”
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Quantitative depth profiling of an alternating Pt/Co multilayer and a Pt–Co alloy multilayer by SIMS using a Buckminsterfullerene (C 60) source by Kim, Kyung Joong, Simons, David, Gillen, Greg

“…A Buckminsterfullerene ion beam has been applied to the depth profiling of an alternating pure Pt and pure Co multilayer. Quantitative depth profiling was…”
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Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry.  2. Investigation of Sputter-Induced Topography, Chemical Damage, and Depolymerization Effects by Mahoney, Christine M, Fahey, Albert J, Gillen, Greg, Xu, Chang, Batteas, James D

“…Poly(methyl methacrylate) (PMMA) thin films (∼150 nm) on silicon were bombarded with SF5 + polyatomic primary ion projectiles at −75 °C, 25 °C, and 125 °C. The…”
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Aerosol Collection Efficiency of a Graded Metal-Fiber Filter at High Airflow Velocity (10 m s-1) by Klouda, George A., Fletcher, Robert A., Gillen, J. Greg, Verkouteren, Jennifer R.

“…A non-woven graded metal-fiber filter was characterized for its collection efficiency as a function of particle size at an airflow velocity of 10 m s −1 …”
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Bandlike Transport in Strongly Coupled and Doped Quantum Dot Solids: A Route to High-Performance Thin-Film Electronics by Choi, Ji-Hyuk, Fafarman, Aaron T, Oh, Soong Ju, Ko, Dong-Kyun, Kim, David K, Diroll, Benjamin T, Muramoto, Shin, Gillen, J. Greg, Murray, Christopher B, Kagan, Cherie R

“…We report bandlike transport in solution-deposited, CdSe QD thin-films with room temperature field-effect mobilities for electrons of 27 cm2/(V s). A…”
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Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles by Fuoco, Erick R, Gillen, Greg, Wijesundara, Muthu B. J, Wallace, William E, Hanley, Luke

“…In this paper we examine the mechanism of secondary ion yield enhancements previously observed for polyatomic projectiles by measuring the weight loss, volume…”
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UV photopatterning of alkanethiolate monolayers self-assembled on gold and silver by Tarlov, Michael J, Burgess, Donald R. F, Gillen, Greg

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Incorporation of Cesium Borocaptate onto Silicon Nanowires as a Delivery Vehicle for Boron Neutron Capture Therapy by Jiang, Ke, Coffer, Jeffery L, Gillen, J. Greg, Brewer, Timothy M

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Negative cesium sputter ion source for generating cluster primary ion beams for secondary ion mass spectrometry analysis by Gillen, Greg, King, Lance, Freibaum, Brian, Lareau, Richard, Bennett, Joe, Chmara, Frank

“…A cesium sputter ion source has been used to generate novel cluster and monoatomic primary ion beams for secondary ion mass spectrometry (SIMS). The source…”
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Visualizing shed skin cells in fingerprint residue using dark‐field microscopy by Muramoto, Shin, Osborn, William, Gillen, Greg

“…This proof‐of‐concept study shows that dark‐field microscopy provides sufficient contrast for cell visualization in fingerprints with high sebum content…”
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Performance of a C60+ ion source on a dynamic SIMS instrument by FAHEY, Albert J, GILLEN, Greg, CHI, Peter, MAHONEY, Christine M

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