Search Results - "GEORGA, S. N"

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  1. 1

    Dielectric relaxation processes in epoxy resin--ZnO composites by Soulintzis, A, Kontos, G, Karahaliou, P, Psarras, G.C, Georga, S.N, Krontiras, C.A

    “…Polymer matrix-ZnO microcomposites were prepared in different filler concentrations. The electrical relaxation dynamics of all samples was examined by means of…”
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    Journal Article
  2. 2

    Dielectric relaxations in polyoxymethylene and in related nanocomposites: Identification and molecular dynamics by Karahaliou, P.K., Kerasidou, A.P., Georga, S.N., Psarras, G.C., Krontiras, C.A., Karger-Kocsis, J.

    Published in Polymer (Guilford) (15-12-2014)
    “…Broadband dielectric spectroscopy (BDS) is employed for the study of the dielectric response of Polyoxymethylene/boehmite alumina (POM/alumina) and…”
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    Journal Article
  3. 3

    Probing the dielectric response of polyurethane/alumina nanocomposites by Kalini, A, Gatos, K.G, Karahaliou, P.K, Georga, S.N, Krontiras, C.A, Psarras, G.C

    “…The dielectric properties of polyurethane (PUR) latex-boehmite alumina nanocomposites were investigated by means of broadband dielectric spectroscopy in the…”
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    Journal Article
  4. 4

    Influence of thermal oxidation on the interfacial properties of ultrathin strained silicon layers by Ioannou-Sougleridis, V., Kelaidis, N., Skarlatos, D., Tsamis, C., Georga, S.N., Krontiras, C.A., Komninou, Ph, Speliotis, Th, Dimitrakis, P., Kellerman, B., Seacrist, M.

    Published in Thin solid films (01-06-2011)
    “…In this work we examine the influence of thermal oxidation on the electrical characteristics of ultra-thin strained silicon layers grown on relaxed…”
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  5. 5

    Dielectric and conductivity processes in poly(ethylene terephthalate) and poly(ethylene naphthalate) homopolymers and copolymers by Psarras, G. C., Beobide, A. Soto, Voyiatzis, G. A., Karahaliou, P. K., Georga, S. N., Krontiras, C. A., Sotiropoulos, J.

    “…Electrical relaxation and conductivity processes in amorphous and semicrystalline poly(ethylene terephthalate) (PET) and poly(ethylene naphthalate) (PEN)…”
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  6. 6

    High volume fraction carbon nanotube-epoxy composites by Spitalsky, Z, Tsoukleri, G, Tasis, D, Krontiras, C, Georga, S N, Galiotis, C

    Published in Nanotechnology (07-10-2009)
    “…A versatile processing technique for fabricating epoxy nanocomposites with a high weight fraction of oxidized multi-walled carbon nanotubes is presented. Thin…”
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    Journal Article
  7. 7

    HNBR and its MWCNT reinforced nanocomposites: Crystalline morphology and electrical response by Psarras, G.C., Sofos, G.A., Vradis, A., Anastassopoulos, D.L., Georga, S.N., Krontiras, C.A., Karger-Kocsis, J.

    Published in European polymer journal (01-05-2014)
    “…[Display omitted] •Crystallinity of HNBR and MWCNT/HNBR systems increases with the addition of MWCNTs.•Recorded relaxations are related to the polymer matrix…”
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  8. 8

    Controllable growth of stable germanium dioxide ultra-thin layer by means of capacitively driven radio frequency discharge by Svarnas, P., Botzakaki, M.A., Skoulatakis, G., Kennou, S., Ladas, S., Tsamis, C., Georga, S.N., Krontiras, C.A.

    Published in Thin solid films (29-01-2016)
    “…It is well recognized that native oxide of germanium is hygroscopic and water soluble, while germanium dioxide is thermally unstable and it is converted to…”
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  9. 9

    A systematic Mössbauer spectroscopy study of Y3Fe5O12 samples displaying different magnetic ac-susceptibility and electric permittivity spectra by Varouti, E., Devlin, E., Sanakis, Y., Pissas, M., Christides, C., Tomara, G.N., Karahaliou, P.K., Georga, S.N., Krontiras, C.A.

    “…•The frequency dependence of χ and ∊ of Y3Fe5O12 (YIG) was measured.•Only YIG samples annealed below 1470 °C exhibit dispersion in the kHz region.•Broad…”
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  10. 10

    Germanium substrate loss during low temperature annealing and its influence on ion-implanted phosphorous dose loss by Ioannou, N., Skarlatos, D., Tsamis, C., Krontiras, C. A., Georga, S. N., Christofi, A., McPhail, D. S.

    Published in Applied physics letters (08-09-2008)
    “…In this work we demonstrate germanium loss from uncapped substrates during low temperature drive-in annealing in inert ambient. An Arrhenius law with an…”
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    Journal Article
  11. 11

    Characterization of physical and electrical properties of BaTiO3 films deposited on p-Si by modified polymeric precursors by KONOFAOS, N, ZHONGCHUN WANG, GEORGA, S. N, KRONTIRAS, C. A, PISANIAS, M. N, SOTIROPOULOS, J, EVANGELOU, E. K

    Published in Journal of electronic materials (01-09-2005)
    “…Highly uniform BaTiO3 (BTO) films with thickness well below 100 nm were deposited on p-Si by spin coating using a modified polymeric precursor method. The…”
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    Journal Article
  12. 12

    Growth of ZnO nanowires on seeding layers deposited by ALD: The influence of process parameters by Kerasidou, A.P., Bardakas, A., Botzakaki, M., Georga, S.N., Krontiras, C.A., Mergia, K., Psycharis, V.P., Tsamis, C.

    Published in Microelectronic engineering (15-09-2019)
    “…Zinc Oxide (ZnO) nanowires are grown by hydrothermal method on ZnO seed layers deposited by Atomic Layer Deposition (ALD) at different temperatures ranging…”
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  13. 13

    ALD deposited ZrO2 ultrathin layers on Si and Ge substrates: A multiple technique characterization by Botzakaki, M.A., Xanthopoulos, N., Makarona, E., Tsamis, C., Kennou, S., Ladas, S., Georga, S.N., Krontiras, C.A.

    Published in Microelectronic engineering (01-12-2013)
    “…•Ultra thin ZrO2 layers were grown by ALD technique on p-Si, strained Si and p-Ge substrates.•The stoichiometry, thickness and valence band electronic…”
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    Journal Article
  14. 14

    Dielectric response and ac conductivity analysis of hafnium oxide nanopowder by Karahaliou, P K, Xanthopoulos, N, Krontiras, C A, Georga, S N

    Published in Physica scripta (01-12-2012)
    “…The dielectric response of hafnium oxide nanopowder was studied in the frequency range of 10−2-106 MHz and in the temperature range of 20-180 °C. Broadband…”
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    Journal Article
  15. 15

    Transient and AC electrical conductivity of porous silicon thin films by Theodoropoulou, M., Krontiras, C. A., Xanthopoulos, N., Georga, S. N., Pisanias, M. N., Tsamis, C., Nassiopoulou, A. G.

    Published in Physica status solidi. A, Applied research (01-05-2003)
    “…AC impendance spectroscopy measurements as a function of the applied voltage in the range 0.5 V up to 3 V, as well as measurements of the transient current of…”
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    Journal Article Conference Proceeding
  16. 16

    Dielectric relaxation mechanisms in polyoxymethylene/polyurethane/layered silicates hybrid nanocomposites by Tomara, G.N., Karahaliou, P.K., Psarras, G.C., Georga, S.N., Krontiras, C.A., Siengchin, S., Karger-Kocsis, J.

    Published in European polymer journal (01-10-2017)
    “…[Display omitted] •POM/PU/LS nanocomposites produced by Direct Melt (DM) compounding.•POM/PU/LS nanocomposites produced by latex-mediated Masterbatch (MB)…”
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  17. 17

    CuO/Ta₂O₅ core/shell nanoparticles produced by arc-discharge in water by Delaportas, D, Svarnas, P, Alexandrou, I, Georga, S.N, Krontiras, C.A, Xanthopoulos, N.I, Siokou, A, Chalker, P.R

    Published in Materials letters (01-08-2011)
    “…The formation of novel nanoparticles, i.e. CuO/Ta₂O₅ core/shell, via anodic arc-discharge in water is reported. Typical core diameters and shell thicknesses…”
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  18. 18

    Temperature dependence of the transient and AC electrical conductivity of porous silicon thin films by Theodoropoulou, M., Krontiras, C.A., Xanthopoulos, N., Georga, S.N., Pisanias, M.N., Tsamis, C., Nassiopoulou, A.G.

    “…In order to investigate the prevailing conduction mechanisms of porous silicon (PS) thin films AC impedance spectroscopy measurements, as well as transient…”
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  19. 19

    Influence of thermal processing on the electrical characteristics of MOS capacitors on strained-silicon substrates by Kelaidis, N., Ioannou-Sougleridis, V., Skarlatos, D., Tsamis, C., Krontiras, C.A., Georga, S.N., Kellerman, B., Seacrist, M.

    Published in Thin solid films (03-11-2008)
    “…In this work the influence of thermal oxidation and subsequent thermal processing on the electrical characteristics of strained-Silicon (s-Si), MOS capacitors…”
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    Journal Article Conference Proceeding
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