Search Results - "Fuoss, PH"

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    High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography by Hruszkewycz, S. O., Allain, M., Holt, M. V., Murray, C. E., Holt, J. R., Fuoss, P. H., Chamard, V.

    Published in Nature materials (01-02-2017)
    “…Coherent X-ray microscopy by phase retrieval of Bragg diffraction intensities enables lattice distortions within a crystal to be imaged at nanometre-scale…”
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    Journal Article
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    Ferroelectricity in Ultrathin Perovskite Films by Fong, Dillon D., Stephenson, G. Brian, Streiffer, Stephen K., Eastman, Jeffrey A., Auciello, Orlando, Fuoss, Paul H., Thompson, Carol

    “…Understanding the suppression of ferroelectricity in perovskite thin films is a fundamental issue that has remained unresolved for decades. We report a…”
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    Journal Article
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    Stabilization of monodomain polarization in ultrathin PbTiO3 films by Fong, D D, Kolpak, A M, Eastman, J A, Streiffer, S K, Fuoss, P H, Stephenson, G B, Thompson, Carol, Kim, D M, Choi, K J, Eom, C B, Grinberg, I, Rappe, A M

    Published in Physical review letters (31-03-2006)
    “…Using in situ high-resolution synchrotron x-ray scattering, the Curie temperature TC has been determined for ultrathin c-axis epitaxial PbTiO3 films on…”
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    Journal Article
  4. 4

    Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X‑ray Bragg Projection Ptychography by Hruszkewycz, S. O, Holt, M. V, Murray, C. E, Bruley, J, Holt, J, Tripathi, A, Shpyrko, O. G, McNulty, I, Highland, M. J, Fuoss, P. H

    Published in Nano letters (10-10-2012)
    “…We imaged nanoscale lattice strain in a multilayer semiconductor device prototype with a new X-ray technique, nanofocused Bragg projection ptychography…”
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    Journal Article
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    Direct structural determination in ultrathin ferroelectric films by analysis of synchrotron x-ray scattering measurements by FONG, D. D, CIONCA, C, STERN, E. A, YACOBY, Y, STEPHENSON, G. B, EASTMAN, J. A, FUOSS, P. H, STREIFFER, S. K, THOMPSON, Carol, CLARKE, R, PINDAK, R

    “…In order to better understand ferroelectricity in thin films, it is important to explore the atomic-scale structure and the spatial distribution of…”
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    Journal Article
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    Early-stage suppression of Cu (001) oxidation by Eastman, J. A., Fuoss, P. H., Rehn, L. E., Baldo, P. M., Zhou, G.-W., Fong, D. D., Thompson, L. J.

    Published in Applied physics letters (01-08-2005)
    “…In situ synchrotron x-ray studies of the early-stage oxidation behavior of Cu (001) reveal that for Cu 2 O nanoislands, the Cu - Cu 2 O equilibrium phase…”
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    Journal Article
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    In situ X-ray studies of vapor phase epitaxy of PbTiO3 by STEPHENSON, G. B, FONG, D. D, RAMANA MURTY, M. V, STREIFFER, S. K, EASTMAN, J. A, AUCIELLO, O, FUOSS, P. H, MUNKHOLM, A, AANERUD, M. E. M, THOMPSON, Carol

    Published in Physica. B, Condensed matter (01-08-2003)
    “…As part of a program to understand and control the structure of ferroelectric thin films grown by metal organic vapor phase epitaxy (MOVPE), we have used X-ray…”
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    Conference Proceeding Journal Article
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    Structure of GaAs=GaSb incoherent interface after epitaxial growth by BOURRET, A, FUOSS, P. H

    Published in Applied physics letters (31-08-1992)
    “…The structure of GaAs=GaSb(001) incoherent interface has been studied by grazing incidence x-ray scattering. The interface is periodic with a square array of…”
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    Journal Article
  12. 12

    Time-resolved X-ray scattering studies of layer-by-layer epitaxial growth by FUOSS, P. H, KISKER, D. W, LAMELAS, F. J, STEPHENSON, G. B, IMPERATORI, P, BRENNAN, S

    Published in Physical review letters (09-11-1992)
    “…We report the first time-resolved X-ray scattering study of the homoepitaxial growth of GaAs by organometallic vapor-phase epitaxy. The growth mode was…”
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    Journal Article
  13. 13

    In situ synchrotron X-ray studies of PbTiO3 thin films by Fong, D.D., Thompson, C., Streiffer, S.K., Eastman, J.A., Auciello, O., Fuoss, P.H., Stephenson, G.B.

    Published in Annalen der Physik (01-01-2004)
    “…We have used in situ synchrotron x‐ray scattering to investigate PbTiO3 films grown epitaxially on SrTiO3 (001) substrates. When the films are cooled below a…”
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    Journal Article
  14. 14

    Parallel adatom chains on Si(111): A chemisorption-induced surface reconstruction by Wong, GC, Lucas, CA, Loretto, D, Payne, AP, Fuoss, PH

    Published in Physical review letters (15-08-1994)
    “…Using surface x-ray scattering, we have studied a (3[times]1) Si(111) reconstruction induced by chemisorption of CaF[sub 2]. This reconstruction consists of a…”
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    Journal Article
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    Optical characterization of surfaces during epitaxial growth using RDS and GIXS by Kamiya, I., Mantese, L., Aspnes, D.E., Kisker, D.W., Fuoss, P.H., Stephenson, G.B., Brennan, S.

    Published in Journal of crystal growth (01-05-1996)
    “…Structures of (001)GaAs surfaces during organometallic vapor phase epitaxy (OMVPE) have been studied by simultaneous measurements using reflectance difference…”
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    Journal Article Conference Proceeding
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    Atomic scale studies of epitaxial growth processes using X-ray techniques by Kisker, D.W., Stephenson, G.B., Tersoff, J., Fuoss, P.H., Brennan, S.

    Published in Journal of crystal growth (01-05-1996)
    “…In this work we have applied grazing incidence X-ray scattering to the study of nucleation and growth of GaAs by organometallic vapor phase epitaxy. Using the…”
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    Journal Article Conference Proceeding
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    Gallium arsenide surface reconstructions during organometallic vapor-phase epitaxy by Lamelas, F. J., Fuoss, P. H., Imperatori, P., Kisker, D. W., Stephenson, G. B., Brennan, S.

    Published in Applied physics letters (25-05-1992)
    “…In situ surface x-ray scattering studies of the GaAs(001) surface were used to determine whether specific surface reconstructions occur during organometallic…”
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    Journal Article
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    Characterization of vapor phase growth using X-ray techniques by Kisker, D.W., Stephenson, G.B., Fuoss, P.H., Brennan, S.

    Published in Journal of crystal growth (01-01-1995)
    “…Chemical vapor deposition environments, while technologically quite important, are difficult to study using traditional analytical probes, such as…”
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    Journal Article Conference Proceeding
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    Native oxidation of the Si(001) surface : evidence for an interfacial phase by RENAUD, G, FUOSS, P. H, OURMAZD, A, BEVK, J, FREER, B. S, HAHN, P. O

    Published in Applied physics letters (11-03-1991)
    “…We have used grazing incidence x-ray scattering techniques to investigate the structure of the Si-SiO2 interface, obtained by native oxidation of a Si(001)…”
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    Journal Article