Search Results - "Fuhrmann, Marc"

Determination of layer morphology of rough layers in organic light emitting diodes by X‐ray reflectivity by Sachs, Ian, Fuhrmann, Marc, Deferme, Wim, Möbius, Hildegard

“…X‐ray reflectivity (XRR) has been proven to be a useful tool to investigate thin layers as well as buried interfaces in stacks built of very thin layers…”
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Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic Crosstalk by Fuhrmann, Marc, Musyanovych, Anna, Thoelen, Ronald, von Bomhard, Sibylle, Möbius, Hildegard

“…Encapsulated magnetic nanoparticles are of increasing interest for biomedical applications. However, up to now, it is still not possible to characterize their…”
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Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy by Krivcov, Alexander, Ehrler, Jasmin, Fuhrmann, Marc, Junkers, Tanja, Möbius, Hildegard

“…Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped…”
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Inkjet‐Printed Lenses with Adjustable Contact Angle to Improve the Light Out‐Coupling of Organic Light‐Emitting Diodes by Sachs, Ian, Fuhrmann, Marc, Verboven, Inge, Basak, Indranil, Deferme, Wim, Möbius, Hildegard

“…The enhancement of the out‐coupling efficiency of organic light‐emitting diodes (OLEDs) is still the subject of research and development. Bottom‐emission OLEDs…”
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The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy by Fuhrmann, Marc, Krivcov, Alexander, Musyanovych, Anna, Thoelen, Ronald, Möbius, Hildegard

“…Topographic cross‐talk is still an issue in magnetic force microscopy (MFM) as well as in electric force microscopy (EFM). Using interleave mode measurements,…”
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Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy by Fuhrmann, Marc, Musyanovych, Anna, Thoelen, Ronald, Moebius, Hildegard

“…Abstract Electrostatic Force Microscopy has been proven to be a precise and versatile tool to perform quantitative measurements of the dielectric constant of…”
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