Search Results - "Fuessel, W"

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  1. 1

    ZnO(CdS)/CIS/Mo solar cells characterized by modulation capacitance voltage measurements by Ngo Duong Sinh, Scheer, R., Kliefoth, K., Fussel, W., Fuhs, W.

    “…From modulation capacitance voltage (MCV) measurements we determined a voltage V/sub s/ of several hundred mV at the depletion region in CuInS/sub 2/ under PV…”
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    Conference Proceeding
  2. 2

    Anodic passivation of SiGe by Rappich, J, Füssel, W

    Published in Microelectronics and reliability (01-04-2000)
    “…We have investigated the oxide composition and the electronic behavior of the interface of anodically and thermally oxidized SiGe single crystals and epitaxial…”
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    Journal Article
  3. 3

    Two types of traps at the Si/SiO sub(2) interface characterized by their cross sections by Albohn, J, Fuessel, W, Sinh, Ngo Duong, Kliefoth, K, Flietner, H, Fuhs, W

    Published in Microelectronic engineering (01-01-1999)
    “…The dispersion behavior of traps at the Si/SiO sub(2) interface has been investigated applying the modulation capacitance voltage method. N-type MOS samples of…”
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    Journal Article
  4. 4

    Voltage and current loss in semiconductor solar cells from MCV and simultaneous IV measurements by Sinh, Ngo Duong, Spieβ, F., Kliefoth, K., Füssel, W.

    Published in Solar energy materials and solar cells (01-11-1997)
    “…We present a method for determining the voltage and current loss in solar cells using the modulation capacitance voltage measuring technique. Both losses can…”
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    Journal Article