Search Results - "Fritzinger, L."

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  1. 1

    Reverse L-shape sealed poly-buffer LOCOS technology by Sung, J.M., Lu, C.Y., Fritzinger, L.B., Sheng, T.T., Lee, K.H.

    Published in IEEE electron device letters (01-11-1990)
    “…A description is presented of a new LOCOS (local oxidation of silicon) isolation process, reverse-L-shaped sealed poly-buffer LOCOS (RLS-PBL), which can…”
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    Journal Article
  2. 2

    A folded extended window MOSFET for ULSI applications by Lu, C.-Y., Yaney, D.S., Lee, K.H., Twiford, M.S., Tsai, N.-S., Kook, T., Fritzinger, L.B., Chen, M.-L., Yang, T.S.

    Published in IEEE electron device letters (01-08-1988)
    “…A novel, simple, and straightforward technology, FEWMNOS, for a high-packing-density LDD CMOS device, is described. A salicide polysilicon layer, termed a…”
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    Journal Article
  3. 3
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    Integration of poly buffered LOCOS and gate processing for submicrometer isolation technique by Juengling, W., Hillenius, S.J., Chen, M.L., Fritzinger, L.B.

    Published in IEEE transactions on electron devices (01-12-1991)
    “…A modified poly buffered LOCOS (PBL) process is described which simplifies processing and provides advantages over conventional PBL and LOCOS processes. The…”
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    Journal Article
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  6. 6

    An Integrated Isolation/Gate Process For Sub-quarter Micron Technologies by Kangar, Hillenius, Baker, Nakahara, Chang, Chong-Cheng Fu, Fritzinger, Giniecki

    Published in Symposium 1993 on VLSI Technology (1993)
    “…We have demonstrated the feasibility of a novel process in which the oxide/poly stack used in poly buffer LOCOS (PBL) is the same as the oxide/poly of the…”
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    Conference Proceeding
  7. 7

    25 /spl Aring/ gate oxide without boron penetration for 0.25 and 0.3-/spl mu/m PMOSFETs by Liu, C.T., Ma, Y., Cheung, K.P., Chang, C.P., Fritzinger, L., Becerro, J., Luftman, H., Vaidya, H.M., Colonell, J.I., Kamgar, A., Minor, J.F., Murray, R.G., Lai, W.Y.C., Pai, C.S., Hillenius, S.J.

    “…Very thin gate oxides are necessary for small CMOS transistors. However, one major challenge is boron penetration through the thin gate oxides in…”
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    Conference Proceeding