Search Results - "Frand, G."

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    Depth profiling of W, O and H in tungsten trioxide thin films using RBS and ERDA techniques by Bohnke, O., Frand, G., Fromm, M., Weber, J., Greim, O.

    Published in Applied surface science (1996)
    “…Tungsten trioxide thin films obtained by vacuum evaporation of tungsten oxide powder of high purity were analyzed using Rutherford backscattering spectroscopy…”
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    Journal Article
  2. 2

    Tuning of Metal/Insulator Transition around Room Temperature of Perovskites Sm1-xNdxNiO3 by Frand, G., Bohnke, O., Lacorre, P., Fourquet, J.L., Carré, A., Eid, B., Théobald, J.G., Gire, A.

    Published in Journal of solid state chemistry (15-11-1995)
    “…We report here a study of the synthesis and properties of the solid solution series Sm1-xNdxNiO3. It was found to crystallize in the GdFeO3-type…”
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