Search Results - "Franco, Francisco J"

Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories by Korkian, Golnaz, Leon, Daniel, Franco, Francisco J., Fabero, Juan C., Letiche, Manon, Morilla, Yolanda, Martin-Holgado, Pedro, Puchner, Helmut, Mecha, Hortensia, Clemente, Juan A.

“…In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers…”
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A Method to Neutralize the Impact of DVS on the Reliability of COTS SRAMs With ECC by Using Periodic Scrubbing by Rezaei, Mohammadreza, Franco, Francisco J., Hubert, Guillaume, Clemente, Juan A.

“…Dynamic voltage scaling (DVS) can be used to reduce the power consumption of onboard systems by dynamically lowering the bias voltage of volatile static random…”
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Reliability of Error Correction Codes Against Multiple Events by Accumulation by Clemente, Juan A., Rezaei, Mohammadreza, Franco, Francisco J.

“…Modern nanoscale devices with storage capacity typically implement error correction codes (ECCs) in order to cope with the effects of natural radiation. Thus,…”
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El consentimiento informado como un continuo narrativo by Serrano Franco, Francisco J.

“…El consentimiento informado (CI) suele entenderse como una declaración, comúnmente escrita, con la que una persona acepta, de manera libre e informada,…”
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Impact of the Bitcell Topology on the Multiple-Cell Upsets Observed in VLSI Nanoscale SRAMs by Clemente, Juan A., Hubert, Guillaume, Rezaei, Mohammadreza, Franco, Francisco J., Mecha, Hortensia

“…This article presents an analysis of the multiple events [and more specifically, multiple-cell upsets (MCUs)] that may occur at successive generations of bulk…”
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Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets by Ramezani, Reza, Clemente, Juan Antonio, Franco, Francisco J.

“…•A new statistical model for reliability estimation of FPGA-based designs.•Reliability estimation by taking both SBUs and MCUs into account.•Validating the…”
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Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode by Fabero, Juan Carlos, Mecha, Hortensia, Franco, Francisco J., Clemente, Juan Antonio, Korkian, Golnaz, Rey, Solenne, Cheymol, Benjamin, Baylac, Maud, Hubert, Guillaume, Velazco, Raoul

“…A sensitivity characterization of a Xilinx Artix-7 field programmable gate array (FPGA) against 14.2-MeV neutrons is presented. The content of the internal…”
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Evaluation of a COTS 65-nm SRAM Under 15 MeV Protons and 14 MeV Neutrons at Low VDD by Rezaei, Mohammadreza, Martin-Holgado, Pedro, Morilla, Yolanda, Franco, Francisco J., Fabero, Juan Carlos, Mecha, Hortensia, Puchner, Helmut, Hubert, Guillaume, Clemente, Juan Antonio

“…This article presents an experimental study on the sensitivity of a commercial-off-the-shelf (COTS) bulk 65-nm static random access memory (SRAM) under 15.6…”
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Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests by Franco, Francisco J., Clemente, Juan A., Korkian, Golnaz, Fabero, Juan C., Mecha, Hortensia, Velazco, Raoul

“…In radiation tests on SRAMs or field-programmable gate arrays (FPGAs), two or more independent bitflips can be misled with a multiple event if they…”
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Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles by Korkian, Golnaz, Fabero, Juan Carlos, Hubert, Guillaume, Rezaei, Mohammadreza, Mecha, Hortensia, Franco, Francisco J., Puchner, Helmut, Clemente, Juan Antonio

“…In harsh radiation environments, it is well known that the angle of incidence of impinging particles against the surface of the operating devices has…”
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SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2-MeV Neutrons by Clemente, Juan Antonio, Hubert, Guillaume, Fraire, Juan, Franco, Francisco J., Villa, Francesca, Rey, Solenne, Baylac, Maud, Puchner, Helmut, Mecha, Hortensia, Velazco, Raoul

“…This paper presents a single event upset (SEU) sensitivity characterization at ultralow bias voltage of three generations of commercial off-the-shelf static…”
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Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation by Rezaei, Mohammadreza, Hubert, Guillaume, Martin-Holgado, Pedro, Morilla, Yolanda, Fabero, Juan Carlos, Mecha, Hortensia, Franco, Francisco J., Puchner, Helmut, Clemente, Juan A.

“…In the aerospace industry, commercial-off-the-shelf (COTS) static random access memories (SRAMs) are a cost-effective solution for obtaining high performance…”
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SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles by Fabero, Juan C., Korkian, Golnaz, Franco, Francisco J., Hubert, Guillaume, Mecha, Hortensia, Letiche, Manon, Clemente, Juan A.

“…This paper provides an experimental study of the single-event upset (SEU) susceptibility against thermal neutron radiation of a 28-nm bulk…”
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Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias Voltage by Clemente, Juan Antonio, Hubert, Guillaume, Franco, Francisco J., Villa, Francesca, Baylac, Maud, Mecha, Hortensia, Puchner, Helmut, Velazco, Raoul

“…This paper presents the characterization of the sensitivity to 14-MeV neutrons of a commercial off-the-shelf 90-nm static random access memories manufactured…”
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Statistical Deviations From the Theoretical Only-SBU Model to Estimate MCU Rates in SRAMs by Franco, Francisco J., Clemente, Juan Antonio, Baylac, Maud, Rey, Solenne, Villa, Francesca, Mecha, Hortensia, Agapito, Juan A., Puchner, Helmut, Hubert, Guillaume, Velazco, Raoul

“…This paper addresses a well-known problem that occurs when memories are exposed to radiation: the determination if a bit flip is isolated or if it belongs to a…”
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Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs From MCUs by Clemente, Juan Antonio, Franco, Francisco J., Villa, Francesca, Baylac, Maud, Rey, Solenne, Mecha, Hortensia, Agapito, Juan A., Puchner, Helmut, Hubert, Guillaume, Velazco, Raoul

“…Recently, the occurrence of multiple events in static tests has been investigated by checking the statistical distribution of the difference between the…”
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Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons by Clemente, Juan Antonio, Franco, Francisco J., Villa, Francesca, Baylac, Maud, Ramos, Pablo, Vargas, Vanessa, Mecha, Hortensia, Agapito, Juan A., Velazco, Raoul

“…This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low Power SRAMs (A-LPSRAM) at low bias voltage little above the…”
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Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs by Rezaei, Mohammadreza, Franco, Francisco J., Fabero, Juan Carlos, Mecha, Hortensia, Puchner, Helmut, Clemente, Juan Antonio

“…An experimental study on the SEU sensitivity of 65-nm, 90-nm, and 130-nm volatile bulk COTS SRAMs against thermal neutron irradiation while applying Dynamic…”
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Impact of High Particle Flux in Radiation Ground Tests with Protons by Rezaei, Mohammadreza, Martin-Holgado, Pedro, Morilla, Yolanda, Franco, Francisco J., Fabero, Juan Carlos, Mecha, Hortensia, Puchner, Helmut, Hubert, Guillaume, Clemente, Juan Antonio

“…This abstract presents an experimental study of the impact of using a high flux in radiation ground tests on the measured cross-section of SRAMs. Experimental…”
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Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles by Fabero, Juan C., Korkian, Golnaz, Franco, Francisco J., Mecha, Hortensia, Letiche, Manon, Clemente, Juan A.

“…This paper presents an experimental study of the SEU susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS)…”
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