Search Results - "Frégnaux, M."

  • Showing 1 - 12 results of 12
Refine Results
  1. 1

    Stoichiometry loss induced by ionic bombardment of InP surfaces: A challenge for electrochemistry combined with XPS by Béchu, S., Aureau, D., Vigneron, J., Gonçalves, A-M., Frégnaux, M., Bouttemy, M., Etcheberry, A.

    Published in Electrochemistry communications (01-08-2020)
    “…•Oxidized metallic In-enriched layer on InP detected by electrochemistry and XPS.•Synergy of electrochemistry and XPS analyses to investigate surface…”
    Get full text
    Journal Article
  2. 2

    Gallium-containing sulfide binary and ternary materials by atomic layer deposition: precursor reactivities and growth fine chemistries by Schneider, N., Frégnaux, M., Bouttemy, M., Donsanti, F., Etcheberry, A., Lincot, D.

    Published in Materials today chemistry (01-12-2018)
    “…Gallium sulfide (GaxS) and copper gallium sulfide (CuxGaySz) were synthetized by atomic layer deposition (ALD), using copper acetylacetonate Cu(acac)2,…”
    Get full text
    Journal Article
  3. 3

    Photoelectrochemical passivation of undoped n-InP by ultra-thin polyphosphazene film: Towards a perfect photoanode? by Gonçalves, A.M., Visagli, G., Rakotoarimanana, C.P., Njel, C., Frégnaux, M., Etcheberry, A.

    Published in Electrochimica acta (01-12-2023)
    “…For the first time, the photoanodic behavior of undoped n-InP (≈ 1015 atoms.cm−3) is studied in liquid ammonia at low temperature (-55 °C) under atmospheric…”
    Get full text
    Journal Article
  4. 4
  5. 5

    Chemistry and electronics of single layer MoS2 domains from photoelectron spectromicroscopy using laboratory excitation sources by Frégnaux, M., Kim, H., Rouchon, D., Derycke, V., Bleuse, J., Voiry, D., Chhowalla, M., Renault, O.

    Published in Surface and interface analysis (01-07-2016)
    “…In the recent context of emerging two‐dimensional (2D) materials, a comprehensive set of spatially resolved photoelectron spectroscopic techniques providing…”
    Get full text
    Journal Article
  6. 6

    Chemical engineering of Cu(In,Ga)Se2 surfaces: An absolute deoxidation studied by X-ray photoelectron spectroscopy and Auger electron spectroscopy signatures by Loubat, A., Bouttemy, M., Gaiaschi, S., Aureau, D., Frégnaux, M., Mercier, D., Vigneron, J., Chapon, P., Etcheberry, A.

    Published in Thin solid films (01-07-2017)
    “…CIGS (Cu(In,Ga)Se2) absorbers are among the most efficient for photo-conversion. As part of their manufacturing cycle, absorber surface preparation is crucial…”
    Get full text
    Journal Article
  7. 7

    Chemistry and electronics of single layer MoS 2 domains from photoelectron spectromicroscopy using laboratory excitation sources by Frégnaux, M., Kim, H., Rouchon, D., Derycke, V., Bleuse, J., Voiry, D., Chhowalla, M., Renault, O.

    Published in Surface and interface analysis (01-07-2016)
    “…In the recent context of emerging two‐dimensional (2D) materials, a comprehensive set of spatially resolved photoelectron spectroscopic techniques providing…”
    Get full text
    Journal Article
  8. 8

    Bipolar self-doping in ultra-wide bandgap spinel ZnGa2O4 by Chi, Z., Tarntair, Fu-Gow, Frégnaux, M., Wu, Wan-Yu, Sartel, C., Madaci, I., Chapon, P., Sallet, V., Dumont, Y., Pérez-Tomás, A., Horng, R.H., Chikoidze, E.

    Published in Materials today physics (01-09-2021)
    “…The spinel group is a growing family of materials with general formulation AB2X4 (the X anion typically being a chalcogen like O and S) with many advanced…”
    Get full text
    Journal Article
  9. 9

    Mass spectrometry techniques in the context of nanometrology by Fregnaux, M., Gaumet, J.J., Dalmasso, S., Laurenti, J.P., Schneider, R.

    Published in Microelectronic engineering (01-08-2013)
    “…[Display omitted] ► CdS QDs smaller than 6nm diameter were produced by soft chemistry methods. ► MALDI-TOF mass spectrometry technique is applied to QDs for…”
    Get full text
    Journal Article Conference Proceeding
  10. 10

    Investigating the optical behavior of electrochemically passivated highly doped n-InP with PPP nanofilm by Labchir, N., Odonnell, J., Fregnaux, M., Gonçalves, A.-M., kaassamani, S., Etcheberry, A., Pelouard, J.L.

    Published in Optical materials (01-07-2023)
    “…InP is one of the most promising substrates for optoelectronic devices as a direct band gap semiconductor. In this study, highly doped n-InP substrate has been…”
    Get full text
    Journal Article
  11. 11

    Chemistry and electronics of single layer MoS sub(2) domains from photoelectron spectromicroscopy using laboratory excitation sources by Fregnaux, M, Kim, H, Rouchon, D, Derycke, V, Bleuse, J, Voiry, D, Chhowalla, M, Renault, O

    Published in Surface and interface analysis (01-07-2016)
    “…In the recent context of emerging two-dimensional (2D) materials, a comprehensive set of spatially resolved photoelectron spectroscopic techniques providing…”
    Get full text
    Journal Article
  12. 12