Non-Destructive Characterization of Selected Types of Films and Other Layers via White Light Reflectance Spectroscopy (WLRS)

In this work, we consider White Light Reflectance Spectroscopy (WLRS) as an optical methodology for the accurate, fast and non-destructive measurement of film thickness in the 1 nm to the 1 mm range and for applications that include microelectronics, photonics, bioanalysis and packaging. Films to wh...

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Bibliographic Details
Published in:	Micro Vol. 2; no. 3; pp. 495 - 507
Main Authors:	Goustouridis, Dimitrios, Raptis, Ioannis, Mpatzaka, Theodora, Fournari, Savvina, Zisis, Grigorios, Petrou, Panagiota, Beltsios, Konstantinos G.
Format:	Journal Article
Language:	English
Published:	01-09-2022
Online Access:	Get full text
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Summary:	In this work, we consider White Light Reflectance Spectroscopy (WLRS) as an optical methodology for the accurate, fast and non-destructive measurement of film thickness in the 1 nm to the 1 mm range and for applications that include microelectronics, photonics, bioanalysis and packaging. Films to which WLRS is applicable can be either homogeneous or layered-composite ones, while thickness and composition might be fixed or varying with time; in the latter case, real-time monitoring of the kinetics of processes such as certain transitions, film dissolution and bioreactions is possible. We present the basic principles of WLRS and a selection of characteristic application examples of current interest, and we also briefly compare WLRS with alternative methods for film measurement.
ISSN:	2673-8023 2673-8023
DOI:	10.3390/micro2030031