Search Results - "Flores, R.C." :: Katalog Arama

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Lead frame Hillock-Induced Silicon Crack by Flores, R.C., Fabia, M.G., Nabong, M.T., Soria, A.O., Gabunas, C.B.

Published in 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01-07-2006)
“…End customer in circuit test rejects at a rate of 2-5% was sent back to manufacturer for analysis and inspection. Electrical failure analysis had revealed some…”

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Understanding Protective Overcoat Damages: Failure Analysis to the Next Level by Abitan, F.V., Angeles, R.C., Fabia, M.G., Flores, R.C., Gabunas, C.B.

Published in 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01-07-2006)
“…Failure analysis (FA) is key in root cause identification for any problem solving journey. Diagnosis given provides insights on mechanisms by which failures…”

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A new complication of permanent indwelling central venous catheters using high-dose fluorouracil and leucovorin by Ardalan, B, Flores, M R

Published in Journal of clinical oncology (01-02-1993)

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