Search Results - "Fitsych, E. I."
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Defects in Arsenic Implanted р+–n- and n+–p- Structures Based on MBE Grown CdHgTe Films
Published in Russian physics journal (01-02-2018)“…Complex studies of the defect structure of arsenic-implanted (with the energy of 190 keV) Cd x Hg 1–x Te ( x = 0.22) films grown by molecular-beam epitaxy are…”
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Defect structure of CdxHg1 − xTe films grown by liquid-phase epitaxy, studied by means of low-energy ion treatment
Published in Semiconductors (Woodbury, N.Y.) (01-09-2011)“…Treatment with low-energy ions and measurements of electrical parameters of samples have been used to study the defect structure of Cd x Hg 1 − x Te films…”
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3
Photoluminescence of CdHgTe solid solutions subjected to low-energy ion treatment
Published in Semiconductors (Woodbury, N.Y.) (01-02-2014)“…The photoluminescence (PL) of CdHgTe solid solutions subjected to low-energy ion treatment is studied. A blue shift of the peaks in the PL spectra is observed…”
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Defect structure of Cd{sub x}Hg{sub 1-x}Te films grown by liquid-phase epitaxy, studied by means of low-energy ion treatment
Published in Semiconductors (Woodbury, N.Y.) (15-09-2011)“…Treatment with low-energy ions and measurements of electrical parameters of samples have been used to study the defect structure of Cd{sub x}Hg{sub 1-x}Te…”
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5
Size effects in [N(CH3)4]2Zn0.58Cu0.42Cl4 crystals
Published in Crystallography reports (2013)“…The temperature dependences of birefringence in thin [N(CH 3 ) 4 ] 2 Zn 0.58 Cu 0.42 Cl 4 crystals in the thickness range 20 × 10 −6 ≤ d ≤ 500 ↾ 10 −6 m have…”
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6
Defect structure of Cd x Hg1 − x Te films grown by liquid-phase epitaxy, studied by means of low-energy ion treatment
Published in Semiconductors (Woodbury, N.Y.) (01-09-2011)Get full text
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7
Electrical and Optical Studies of Defect Structure of HgCdTe Films Grown by Molecular Beam Epitaxy
Published in Russian physics journal (01-07-2016)“…Electrical and optical studies of defect structure of HgCdTe films grown by molecular beam epitaxy (MBE) are performed. It is shown that the peculiarity of…”
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Relaxation of a radiation-damaged layer formed during ion-beam milling of CdHgTe solid solutions
Published in Technical physics letters (2013)“…We have studied the relaxation of electrical properties in radiation-damaged layers formed during ion-beam milling (IBM) of cadmium mercury telluride (CdHgTe)…”
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Electrical and optical properties of CdHgTe films grown by molecular-beam epitaxy on silicon substrates
Published in Semiconductors (Woodbury, N.Y.) (01-10-2012)“…The electrical and optical properties of epitaxial CdHgTe films grown on silicon substrates by molecular-beam epitaxy have been studied. The results of…”
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