Search Results - "Findlay, S.D."

Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons by Close, R., Chen, Z., Shibata, N., Findlay, S.D.

“…Differential phase contrast images in scanning transmission electron microscopy can be directly and quantitatively related to the gradient of the projected…”
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Dynamics of annular bright field imaging in scanning transmission electron microscopy by Findlay, S.D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Ikuhara, Y.

“…We explore the dynamics of image formation in the so-called annular bright field mode in scanning transmission electron microscopy, whereby an annular detector…”
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Detector non-uniformity in scanning transmission electron microscopy by Findlay, S.D., LeBeau, J.M.

“…A non-uniform response across scanning transmission electron microscope annular detectors has been found experimentally, but is seldom incorporated into…”
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Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy by Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

“…Quantitative agreement on an absolute scale is demonstrated between experiment and simulation for two-dimensional, atomic-resolution elemental mapping via…”
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Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors by Brown, H.G., Shibata, N., Sasaki, H., Petersen, T.C., Paganin, D.M., Morgan, M.J., Findlay, S.D.

“…•Differential phase contrast (DPC) and two ptychography variants are compared.•All systematically underestimate the beam deflection and thus the electric…”
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Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector by Mawson, T., Taplin, D.J., Brown, H.G., Clark, L., Ishikawa, R., Seki, T., Ikuhara, Y., Shibata, N., Paganin, D.M., Morgan, M.J., Weyland, M., Petersen, T.C., Findlay, S.D.

“…Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is…”
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Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopy by Chen, Z., D'Alfonso, A.J., Weyland, M., Taplin, D.J., Allen, L.J., Findlay, S.D.

“…We demonstrate absolute scale agreement between the number of X-ray counts in energy dispersive X-ray spectroscopy using an atomic-scale coherent electron…”
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Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy by Brown, H.G., Ishikawa, R., S´anchez-Santolino, G., Shibata, N., Ikuhara, Y., Allen, L.J., Findlay, S.D.

“…•Existing STEM reconstructions of electric potentials assume very thin (<50 Å) samples.•A new approach suitable to reconstruct samples hundreds of Ångström…”
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Enhanced light element imaging in atomic resolution scanning transmission electron microscopy by Findlay, S.D., Kohno, Y., Cardamone, L.A., Ikuhara, Y., Shibata, N.

“…We show that an imaging mode based on taking the difference between signals recorded from the bright field (forward scattering region) in atomic resolution…”
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High contrast at low dose using a single, defocussed transmission electron micrograph by Clark, L., Petersen, T.C., Williams, T., Morgan, M.J., Paganin, D.M., Findlay, S.D.

“…•Recording in-focus BF-TEM images of samples with a weak effective absorption is dose-inefficient.•Recording images out of focus, and reconstructing using the…”
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Practical aspects of diffractive imaging using an atomic-scale coherent electron probe by Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M.S., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

“…Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two-dimensional convergent beam electron diffraction (CBED)…”
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Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy by Chen, Z., Taplin, D.J., Weyland, M., Allen, L.J., Findlay, S.D.

“…The increasing use of energy dispersive X-ray spectroscopy in atomic resolution scanning transmission electron microscopy invites the question of whether its…”
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The atomic structure of polar and non-polar InGaN quantum wells and the green gap problem by Humphreys, C.J., Griffiths, J.T., Tang, F., Oehler, F., Findlay, S.D., Zheng, C., Etheridge, J., Martin, T.L., Bagot, P.A.J., Moody, M.P., Sutherland, D., Dawson, P., Schulz, S., Zhang, S., Fu, W.Y., Zhu, T., Kappers, M.J., Oliver, R.A.

“…•We have studied the atomic structure of polar and non-polar InGaN quantum wells.•The non-polar (11-20) InGaN quantum wells contain indium-rich clusters,…”
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Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric by Pollock, J.A., Weyland, M., Taplin, D.J., Allen, L.J., Findlay, S.D.

“…•Thickness can be determined by comparing experimental and simulated PACBED patterns.•Automated comparison using a sum square difference metric is presented in…”
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Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy by Dycus, J.H., Xu, W., Sang, X., D'Alfonso, A.J., Chen, Z., Weyland, M., Allen, L.J., Findlay, S.D., LeBeau, J.M.

“…Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the…”
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Lattice-resolution contrast from a focused coherent electron probe. Part I by Allen, L.J., Findlay, S.D., Oxley, M.P., Rossouw, C.J.

“…To develop a Bloch wave framework for lattice-resolution contrast derived from coherent or incoherent scattering of an electron probe focused onto a crystal,…”
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Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study by Findlay, S.D., Lugg, N.R., Shibata, N., Allen, L.J., Ikuhara, Y.

“…There is strong interest in lithium imaging, particularly because of its significance in battery materials. However, light atoms only scatter electrons weakly…”
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Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering by D’Alfonso, A.J., Cosgriff, E.C., Findlay, S.D., Behan, G., Kirkland, A.I., Nellist, P.D., Allen, L.J.

“…The implementation of spherical aberration-corrected pre- and post-specimen lenses in the same instrument has facilitated the creation of sub-Ångstrom electron…”
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The effect of vacancies on the annular dark field image contrast of grain boundaries: A SrTiO3 case study by Lee, H.-S., Findlay, S.D., Mizoguchi, T., Ikuhara, Y.

“…The analysis of grain boundary structure in high resolution electron microscopy is often hindered by contrast variation within the grain boundary region which…”
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Volcano structure in atomic resolution core-loss images by D’Alfonso, A.J., Findlay, S.D., Oxley, M.P., Allen, L.J.

“…A feature commonly present in simulations of atomic resolution electron energy loss spectroscopy images in the scanning transmission electron microscope is the…”
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