Search Results - "Figge, Martin"

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  1. 1

    Fabrication and electrochemical characterization of ruthenium nanoelectrodes by Allani, Sonja, Jupe, Andreas, Figge, Martin, Goehlich, Andreas, Vogt, Holger

    “…The Fraunhofer IMS has recently developed a technique for producing nanoelectrodes that are generated by atomic layer deposition (ALD) in a via deep reactive…”
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    Journal Article
  2. 2

    Tapering of nanoelectrodes for an intracellular contact via a double hard mask technique by Allani, Sonja, Jupe, Andreas, Figge, Martin, Goehlich, Andreas, Vogt, Holger

    “…To realize an intracellular contact between nanoelectrodes and cells, a sufficient small electrode diameter is needed [1]. A sacrificial layer process…”
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    Conference Proceeding
  3. 3

    Light switched Plasma Charging Damage protection device allowing high field characterization by Sommer, S.P., Paschen, U., Figge, M., Vogt, H.

    “…One of the main problems in Plasma Charging Damage (PCD) measurement is the need to reference the measured damage to a zero level. Especially when the…”
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    Conference Proceeding
  4. 4

    Glyceraldehyde-3-phosphate dehydrogenase gene diversity in eubacteria and eukaryotes: evidence for intra- and inter-kingdom gene transfer by Figge, R M, Schubert, M, Brinkmann, H, Cerff, R

    Published in Molecular biology and evolution (01-04-1999)
    “…Cyanobacteria contain up to three highly divergent glyceraldehyde-3-phosphate dehydrogenase (GAPDH) genes: gap1, gap2, and gap3. Genes gap1 and gap2 are…”
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    Journal Article
  5. 5

    GAPDH gene diversity in spirochetes: a paradigm for genetic promiscuity by Figge, R M, Cerff, R

    Published in Molecular biology and evolution (01-12-2001)
    “…In this study we have determined gap sequences from nine different spirochetes. Phylogenetic analyses of these sequences in the context of all other available…”
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    Journal Article
  6. 6

    Light Switched Plasma Charging Protection Device for High-Field Characterization and Flash Memory Protection by Sommer, Sebastian P, Paschen, Uwe, Figge, Martin, Vogt, Holger

    “…Plasma charging damage (PCD) is usually measured by comparing the measurement results of an undamaged reference structure to the results of structures, which…”
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    Magazine Article