Simple phase-space trajectory calculation for Monte Carlo device simulation including screened impurity scattering

A phase-space-step trajectory calculation within the scheme of self-scattering is presented. In addition, impurity scattering is approximated by the inverse microscopic relaxation time of the Ridley model. The resulting Monte Carlo algorithm is faster by a factor in the order of 15 than one, which i...

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Bibliographic Details

Published in:	1999 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD'99 (IEEE Cat. No.99TH8387) pp. 31 - 34
Main Authors:	Bufler, F.M., Yoder, P.D., Fichtuer, W.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 1999
Subjects:	Ballistic transport Computational modeling Doping profiles Electrons Impurities Microscopy Monte Carlo methods MOSFET circuits Particle scattering Semiconductor process modeling
Online Access:	Get full text
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