Search Results - "Fen, Yong Puay"
-
1
3-D Modeling and Characterization for Die Attach Process
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-10-2016)“…A new 3-D model for the die attach (DA) process is established and validated in this paper. With this model, the fluid flow characteristics of the DA process…”
Get full text
Journal Article -
2
Copper wire bond reliability evaluation using a modular test chip
Published in 2012 IEEE 14th Electronics Packaging Technology Conference (EPTC) (01-12-2012)“…The use of copper wire for wire bonding integrated circuits (ICs) has increased significantly in recent years, driven mainly by the dramatic increase in the…”
Get full text
Conference Proceeding