Search Results - "Feige, V."

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  1. 1

    Towards Neural Network Classification of Terahertz Measurements for Determining the Number of Coating Layers by Busboom, I., Rohde, N., Christmann, S., Feige, V.K.S., Haehnel, H., Tibken, B.

    “…To determine layer thicknesses with terahertz time-domain spectroscopy, the number of layers must usually be known. However, in some applications the number of…”
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    Conference Proceeding
  2. 2

    Failure analysis of integrated devices by scanning thermal microscopy (SThM) by Fiege, G.B.M., Feige, V., Phang, J.C.H, Maywald, M., Gorlich, S., Balk, L.J.

    Published in Microelectronics and reliability (01-06-1998)
    “…High power densities dissipated in smaller and faster devices are leading to major thermal problems of semiconductor devices. The resulting local heat…”
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    Journal Article Conference Proceeding
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    Non-contact multilayer thickness measurements with reflection-mode terahertz time-domain spectroscopy by Feige, V. K. S., Nix, S., Ellrich, F., Jonuscheit, J., Beigang, R.

    “…The global increase of plastic production has led to an increase in coating materials available for plastics, as many plastics need to be protected from…”
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    Conference Proceeding