X-ray and EUV diagnostics for the Nevada Terawatt Facility: plasma imaging, spectroscopy, and polarimetry

X-ray and EUV diagnostics for the Nevada Terawatt Facility: plasma imaging, spectroscopy, and polarimetry

Summary form only given. A wide variety of advanced extreme ultraviolet (EUV) and X-ray diagnostics are being developed for the Nevada Terawatt Facility (NTF) at the University of Nevada, Reno. Time-resolved short-wavelength imaging, backlighting, imaging spectroscopy, and polarization spectroscopy...

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Bibliographic Details
Published in:IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297) p. 307
Main Authors: Kantsyrev, V.L., Bauer, B.S., Mancini, R.C., Shlyaptseva, A.S., Fdin, D.A., Golovkin, A., Hakel, P., Paraschiv, I., Ammons, N., Hansen, S.
Format: Conference Proceeding
Language:English
Published: IEEE 1999
Subjects:
Density measurement
Density measurement (specific gravity)
Emission spectroscopy
Imaging techniques
Magnetic field measurement
Plasma density
Plasma diagnostics
Plasma flow
Plasma measurements
Plasma temperature
Plasma x-ray sources
Polarimeters
Spectroscopy
Temperature measurement
Ultraviolet sources
Ultraviolet spectroscopy
X ray spectrometers
X-ray imaging
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Summary:Summary form only given. A wide variety of advanced extreme ultraviolet (EUV) and X-ray diagnostics are being developed for the Nevada Terawatt Facility (NTF) at the University of Nevada, Reno. Time-resolved short-wavelength imaging, backlighting, imaging spectroscopy, and polarization spectroscopy will be employed to measure profiles of plasma temperature, density, flow, charge state, and magnetic field. The instruments are state-of-the-art applications of glass capillary converters (GCC), multilayer mirrors (MLM), and crystals. The devices include: a prototype of a new glass-capillary-based two-dimensional imaging spectrometer; a pinhole camera with 6 MCP imagers; a 5-channel crystal/MLM spectrometer ("Polychromator") with fast X-ray diodes and an added transmission grating spectrometer; a convex-crystal X-ray survey spectrometer; a prototype of an X-ray polarimeter/spectrometer; and a multiframe X-pinch backlighter yielding point-projection microscopy with few-micron, sub-ns resolution. Spectroscopic data will be interpreted with state-of-the-art spectral calculations that take into account line intensity, plasma broadening, opacity, and polarization effects, for both resonance and satellite lines. Emission spectroscopy will be used to measure plasma density and temperature in the hot plasma around exploding wires, with polarization measurements helping to determine the electron distribution function and the magnetic field in this region. The density and temperature of the high-density, low-temperature plasma inside exploding Al wires will be measured with absorption spectroscopy.
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ISBN:0780352246
9780780352247
ISSN:0730-9244
2576-7208
DOI:10.1109/PLASMA.1999.829679