Search Results - "Fartmann, Michael"

Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS by Průša, Stanislav, Procházka, Pavel, Bábor, Petr, Šikola, Tomáš, ter Veen, Rik, Fartmann, Michael, Grehl, Thomas, Brüner, Philipp, Roth, Dietmar, Bauer, Peter, Brongersma, Hidde H

“…Low-energy ion scattering (LEIS) is known for its extreme surface sensitivity, as it yields a quantitative analysis of the outermost surface as well as highly…”
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Routine TOF-SIMS instrument control using polycarbonate material by Fartmann, Michael, Kersting, Reinhard, Hagenhoff, Birgit

“…We suggest the use of polycarbonate as reference material for the routine time of flight (TOF) SIMS (TOF‐SIMS) instrument control under quality management…”
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Combining dynamic and static depth profiling in low energy ion scattering by ter Veen, Rik, Fartmann, Michael, Kersting, Reinhard, Hagenhoff, Birgit

“…The advantages of combining dynamic and static depth profiling in low energy ion scattering are demonstrated for an Si/SiOx/W/Al2O3 ALD stack. Dynamic depth…”
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Preparation of cells cultured on silicon wafers for mass spectrometry analysis by Wittig, Andrea, Wiemann, Martin, Fartmann, Michael, Kriegeskotte, Christian, Arlinghaus, Heinrich F., Zierold, Karl, Sauerwein, Wolfgang

“…The distribution of specific atoms and molecules within living cells is of high interest in bio‐medical research. Laser secondary neutral mass spectrometry…”
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