Search Results - "Farmakis, F."

Silicon/LiNi0·8Co0·15Al0·05O2 lithium-ion pouch cells charging and discharging at −40 °C temperature by Subburaj, T., Brevet, W., Farmakis, F., Tsiplakides, D., Balomenou, S., Strataki, N., Elmasides, C., Samaniego, B., Nestoridi, M.

“…Though Li-ion batteries offer excellent performance at room temperature, their operation at subzero temperatures is restricted by the capacity and the poor…”
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Impact of electrolyte on the electrochemical performance of Lithium-ion half and full cells with Silicon film anodes by Farmakis, F., Elmasides, C., Selinis, P., Georgoulas, N.

“…Amongst anode materials for lithium ion batteries, silicon's high theoretical capacity, environmental friendliness, low potential vs Li/Li+, material abundance…”
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Permanent water swelling effect in low temperature thermally reduced graphene oxide by Papamatthaiou, S., Argyropoulos, D.-P., Masurkar, A., Cavallari, M. R., Farmakis, F., Kymissis, I., Georgoulas, N.

“…We demonstrate permanent water trapping in reduced graphene oxide after high relative humidity exposure. For this purpose, we grew graphene oxide films via…”
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High Specific Energy Lithium Cells for Space Exploration by Farmakis, F., Georgoulas, N., Karafyllidis, I., Amoiridis, I., Elmasides, C., Balomenou, S., Tsiplakides, D., Nestoridi, M.

“…The paper discusses development under an ESA TRP activity (Contract No. 4000109879/13/NL/LvH) with a target of high specific energy Lithium-ion cells, capable…”
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Field-effect transistors with thin ZnO as active layer for gas sensor applications by Farmakis, F.V., Speliotis, Th, Alexandrou, K.P., Tsamis, C., Kompitsas, M., Fasaki, I., Jedrasik, P., Petersson, G., Nilsson, B.

“…Zinc oxide based field-effect devices prepared for gas sensing applications are studied. For this purpose, bottom-gate transistors were fabricated using Pd as…”
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Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors by Farmakis, F.V., Brini, J., Kamarinos, G., Dimitriadis, C.A.

“…In this letter, we present experimental data showing that hot-carrier stress in laser annealed polycrystalline silicon thin-film transistors provokes an…”
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Characterization of thin film transistors fabricated on different sequential lateral solidified poly-silicon substrates by Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Farmakis, F.V., Voutsas, A.T.

“…Polycrystalline silicon quality is a key issue parameter for the performance and reliability of thin film transistors. Therefore in the present work, the…”
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Device degradation behavior and polysilicon film morphology of thin film transistors fabricated using advanced excimer laser lateral solidification techniques by Kouvatsos, D.N., Voutsas, A.T., Michalas, L., Farmakis, F.V., Papaioannou, G.J.

“…The degradation of polysilicon thin film transistors fabricated in films obtained using variations of advanced through-mask excimer laser anneal sequential…”
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Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress by Farmakis, F.V., Kontogiannopoulos, G.P., Kouvatsos, D.N., Voutsas, A.T.

“…Degradation phenomena due to hot carrier stress conditions were investigated in double-gate polysilicon thin film transistors fabricated by sequential lateral…”
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Hydrogenation in laser annealed polysilicon thin-film transistors (TFTs) by Farmakis, F.V., Tsamados, D.M., Brini, J., Kamarinos, G., Dimitriadis, C.A., Miyasaka, M.

“…Hydrogenation effects in excimer laser annealed polysilicon thin-film transistors (TFTs) were studied. Hydrogen plasma formed from hydrogen diluted with Ar or…”
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On-current modeling of large-grain polycrystalline silicon thin-film transistors by Farmakis, F.V., Brini, J., Kamarinos, G., Angelis, C.T., Dimitriadis, C.A., Miyasaka, M.

“…Large-grain excimer laser-annealed polysilicon TFTs are studied. Due to the large grain size of the polysilicon film (about 2.5 /spl mu/m), we propose a model…”
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Grain and grain-boundary control of the transfer characteristics of large-grain polycrystalline silicon thin-film transistors by Farmakis, F.V, Brini, J, Kamarinos, G, Angelis, C.T, Dimitriadis, C.A, Miyasaka, M, Ouisse, T

“…Thin-film transistors (TFTs), fabricated on solid-phase-crystallized polycrystalline silicon (polysilicon) films subjected to laser annealing, were studied…”
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Effects of hydrogenation on the performance and hot-carrier endurance of polysilicon thin-film transistors by Farmakis, F.V., Dimitriadis, C.A., Brini, J., Kamarinos, G.

“…Statistical analysis was performed to investigate the performance and reliability of hydrogenated polysilicon thin-film transistors (TFTs) in relation to the…”
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Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors by Angelis, C. T., Dimitriadis, C. A., Farmakis, F. V., Brini, J., Kamarinos, G., Miyasaka, M.

“…Based on experimental studies of n-channel excimer-laser-annealed polycrystalline silicon thin-film transistors with gate ratio width/length varying from 0.5…”
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Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors by Angelis, C.T., Dimitriadis, C.A., Farmakis, F.V., Brini, J., Kamarinos, G., Miyasaka, M., Stoemenos, I.

“…An analytical model of the above-threshold voltage transconductance of large grain polycrystalline silicon thin-film transistors (TFTs) is presented. The…”
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Hot-carrier phenomena in high temperature processed undoped-hydrogenated n-channel polysilicon thin film transistors (TFTs) by Farmakis, F.V, Dimitriadis, C.A, Brini, J, Kamarinos, G, Gueorguiev, V.K, Ivanov, Tz.E

“…A study on hot-carrier phenomena in high temperature processed undoped and hydrogenated n-channel polysilicon thin film transistors (TFTs) is presented. First,…”
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Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors by Dimitriadis, C.A, Kimura, M, Miyasaka, M, Inoue, S, Farmakis, F.V, Brini, J, Kamarinos, G

“…Hot-carrier effects have been investigated in n-channel thin-film transistors fabricated on large grain polysilicon films. The bias-stress conditions for…”
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Elucidation of the influence of operating temperature in LiNi0.8Co0.15Al0.05O2/silicon and LiNi0.8Co0.15Al0.05O2/graphite pouch cells batteries cycle-life degradation by Farmakis, F., de Meatza, I., Subburaj, T., Tsiplakides, D., Argyropoulos, D.-P., Balomenou, S., Landa-Medrano, I., Eguia-Barrio, A., Strataki, N., Nestoridi, M.

“…•Direct comparison between LiNi0.8Co0.15Al0.05O2/silicon and LiNi0.8Co0.15Al0.05O2/graphite pouch cells at 5, 25 and 35 oC operation.•Silicon-anode pouch cells…”
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Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors by Hastas, N.A., Dimitriadis, C.A., Farmakis, F.V., Kamarinos, G.

“…The effects of hydrogenation on the performance and stability under electrical stress of p-channel polycrystalline silicon thin-film transistors (polysilicon…”
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Leakage current variation during two different modes of electrical stressing in undoped hydrogenated n-channel polysilicon thin film transistors (TFTs) by Farmakis, F.V., Brini, J., Kamarinos, G., Dimitriadis, C.A., Gueorguiev, V.K., Ivanov, Tz.E.

“…Leakage current evolution during two different modes of electrical stressing in hydrogenated-undoped n-channel polysilicon thin film transistors (TFTs) is…”
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