Search Results - "Fang, Yahao"
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Gate breakdown induced stuck bits in sub-20 nm FinFET SRAM
Published in Applied physics letters (08-07-2024)“…This paper discusses the stuck bits induced by the gate breakdown of PMOS in the sub-20 nm FinFET static random access memory (SRAM) device. After the…”
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Journal Article -
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MZ Core: An Enhanced Matrix Acceleration Engine for HPC/ AI Applications
“…The convergence of High-Performance Computing (HPC) and Artificial Intelligence (AI) has become a promising trend. Due to the different computation patterns of…”
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Conference Proceeding