Methods for measurement of development parameters in the manufacturing line for use in photolithography modeling

One of the outstanding problems of photolithography is the measurement of development parameters, particularly in one's own manufacturing line. We present an inexpensive practical method for obtaining values of development parameters for use in photolithography modeling. The method utilizes the...

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Bibliographic Details
Published in:	IEEE transactions on semiconductor manufacturing Vol. 9; no. 2; pp. 182 - 190
Main Author:	Fahey, K.P.
Format:	Journal Article
Language:	English
Published:	New York, NY IEEE 01-05-1996 Institute of Electrical and Electronics Engineers
Subjects:	Applied sciences Electronics Exact sciences and technology Geometry Lithography Magnetic films Magnetic heads Magnetic recording Manufacturing Microelectronic fabrication (materials and surfaces technology) Packaging machines Particle measurements Production equipment Resists Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Microelectronic fabrication Physical parameter Theoretical study Numerical simulation Measurement method Photolithography Modeling
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Summary:	One of the outstanding problems of photolithography is the measurement of development parameters, particularly in one's own manufacturing line. We present an inexpensive practical method for obtaining values of development parameters for use in photolithography modeling. The method utilizes the actual production equipment used in the fab, as well as the computer modeling package for which the development parameters are being collected. In addressing experimental geometries with which one may carry out such data collection, we discuss the critical issue of standing waves and their impact on measurement accuracy. Two techniques are presented for solving the problem of standing waves and their extreme impact on the quality of collected data. One involves creating a photoactive component latent image in which there are no standing waves. The other is a means by which development parameters may still be obtained for situations such as photolithography of thin film magnetic recording heads, where the standing waves may not necessarily be deconvolved from the development process or data collection. Development parameters using 1.15 /spl mu/m of AZ 4110 resist on a NiFe substrate were measured using the latter technique.
Bibliography:	ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23
ISSN:	0894-6507 1558-2345
DOI:	10.1109/66.492812