Search Results - "Fadakis, E."

Targets and ion sources at CERN-ISOLDE — Facilities and developments by Rothe, S., Au, M., Ballof, J., Barbero, E., Bissell, M., Boucherie, A., Bovigny, M., Chrysalidis, K., Crepieux, B., Cruikshank, J., Fadakis, E., Heinke, R., Josa, F., Le, L., Koliatos, A., Piselli, E., Reis, E., Samothrakis, V., Schütt, M., Lambert, L., Leimbach, D., Marzari, S., Owen, M., Stegemann, S., Vila Gracia, Y.N.

“…At the CERN-ISOLDE radioactive ion beam facility, thick targets are irradiated using a beam of 1.4-GeV protons. One of ISOLDE’s key features is the large…”
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The CERN-ISOLDE fast tape station by Stegemann, S., Atanasov, D., Au, M., Grenier-Boley, E., Butcher, M., Duraffourg, M., Fadakis, E., Feniet, T., Gracia, Y.N. Vila, Giles, T., Konki, J., Le, L., Lică, R., Martins, P., Matheson, E., Mihai, C., Muniz, R. Martinez, Neacşu, C., Pascovici, G., Szczurek, K.A., Warren, S., Rothe, S.

“…The employment of a suitable radioactive decay spectroscopy setup is essential for the operation of radioactive ion beam (RIB) facilities. CERN-ISOLDE recently…”
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Effectiveness Analysis of a Non-Destructive Single Event Burnout Test Methodology by Oser, P., Mekki, J., Spiezia, G., Fadakis, E., Foucard, G., Peronnard, P., Masi, A., Gaillard, R.

“…It is essential to characterize power MosFETs regarding their tolerance to destructive Single Event Burnouts (SEB). Therefore, several non-destructive test…”
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Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics by Oser, P., Spiezia, G., Brugger, M., Danzeca, S., Fadakis, E., Foucard, G., Alia, R.G., Losito, R., Masi, A., Mekki, J., Peronnard, P., Ruggiero, G., Secondo, R., Stachyra, K., Gaillard, R.

“…In the context of the CERN 'Radiation To Electronics (R2E)' project, the vulnerability of a variety of components for particle accelerators electronics to…”
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Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics by Spiezia, G., Brugger, M., Danzeca, S., Alia, R. Garcia, Gaillard, R., Fadakis, E., Foucard, G., Losito, R., Masi, A., Mekki, J., Oser, P., Peronnard, P., Ruggiero, G., Secondo, R.

“…In the context of the CERN 'Radiation To Electronics (R2E)' project, the vulnerability of a variety of components for particle accelerators electronics to…”
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Effectiveness analysis of a non-destructive Single Event Burnout test methodology by Oser, P., Mekki, J., Spiezia, G., Fadakis, E., Foucard, G., Peronnard, P., Masi, A., Gaillard, R.

“…It is essential to characterize power MosFETs regarding their tolerance to destructive Single Event Burnouts (SEB). Therefore, several non-destructive test…”
Get full text