Search Results - "FANTON, J. T"
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Beam profile reflectometry : a new technique for dielectric film measurements
Published in Applied physics letters (16-03-1992)“…We describe a new technique for measuring the thickness and optical constants of dielectric, semiconducting, and thin metal films. Beam profile reflectometry…”
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Journal Article -
2
High-sensitivity laser probe for photothermal measurements
Published in Applied physics letters (13-07-1987)“…A high-sensitivity interferometric laser probe has been developed to detect thermally generated surface displacements. Shot-noise-limited detection has been…”
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Journal Article -
3
Photothermal measurements of high Tc superconductors
Published in Applied physics letters (07-08-1989)Get full text
Journal Article -
4
Photothermal Measurements of High T sub c Superconductors
Published in Applied physics letters (07-08-1989)“…A photothermal method is demonstrated for making point measurements of the thermal conductivities of high T sub c superconductors. Images made at room…”
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5
Photothermal measurements of high T c superconductors
Published in Applied physics letters (07-08-1989)“…We demonstrate a photothermal method for making point measurements of the thermal conductivities of high Tc superconductors. Images made at room temperature on…”
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Journal Article