Search Results - "FANTON, J. T"

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  1. 1

    Beam profile reflectometry : a new technique for dielectric film measurements by ROSENCWAIG, A, OPSAL, J, WILLENBORG, D. L, KELSO, S. M, FANTON, J. T

    Published in Applied physics letters (16-03-1992)
    “…We describe a new technique for measuring the thickness and optical constants of dielectric, semiconducting, and thin metal films. Beam profile reflectometry…”
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    Journal Article
  2. 2

    High-sensitivity laser probe for photothermal measurements by FANTON, J. T, KINO, G. S

    Published in Applied physics letters (13-07-1987)
    “…A high-sensitivity interferometric laser probe has been developed to detect thermally generated surface displacements. Shot-noise-limited detection has been…”
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    Journal Article
  3. 3
  4. 4

    Photothermal Measurements of High T sub c Superconductors by Fanton, J T, Mitzi, D B, Kapitulnik, A

    Published in Applied physics letters (07-08-1989)
    “…A photothermal method is demonstrated for making point measurements of the thermal conductivities of high T sub c superconductors. Images made at room…”
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    Journal Article
  5. 5

    Photothermal measurements of high T c superconductors by Fanton, J. T., Mitzi, D. B., Kapitulnik, A., Khuri-Yakub, B. T., Kino, G. S., Gazit, D., Feigelson, R. S.

    Published in Applied physics letters (07-08-1989)
    “…We demonstrate a photothermal method for making point measurements of the thermal conductivities of high Tc superconductors. Images made at room temperature on…”
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    Journal Article