Search Results - "Exarchos, M."

Temperature study of the dielectric polarization effects of capacitive RF MEMS switches by Papaioannou, G., Exarchos, M.-N., Theonas, V., Guoan Wang, Papapolymerou, J.

“…This paper investigates both theoretically and experimentally the dielectric charging effects of capacitive RF microelectromechanical system switches with…”
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Multiple superconducting ring ratchets for ultrasensitive detection of non-equilibrium noises by Gurtovoi, V. L., Exarchos, M., Antonov, V. N., Nikulov, A. V., Tulin, V. A.

“…Magnetic quantum periodicity in the dc voltage is observed when asymmetric rings are switched between superconducting and normal state by a noise or ac…”
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The dc power observed on the half of asymmetric superconducting ring in which current flows against electric field by Gurtovoi, V.L., Antonov, V.N., Exarchos, M., Il’in, A.I., Nikulov, A.V.

“…•The persistent current induces a dc voltage on segments of asymmetric superconducting ring.•The dc voltage is observed when the ring is switched between…”
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On the study of p-channel thin-film transistors fabricated by SLS ELA crystallization techniques by Exarchos, M.A., Moschou, D.C., Papaioannou, G.J., Kouvatsos, D.N., Arapoyanni, A., Voutsas, A.T.

“…The electrical characterization, in terms of drain current, of SLS ELA p-channel polysilicon TFTs is investigated. The study was based on the DLTS technique…”
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Charging of radiation induced defects in RF MEMS dielectric films by Exarchos, M., Papandreou, E., Pons, P., Lamhamdi, M., Papaioannou, G.J., Plana, R.

“…The paper investigates the charging of radiation induced defects in Si 3N 4 and SiO 2 dielectric films, which are used in RF-MEMS switches. The radiation has…”
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Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs by Exarchos, M.A., Papaioannou, G.J., Jomaah, J., Balestra, F.

“…SOI partially depleted body-contact MOSFETs were subjected to static and dynamic hot carrier stress. Drain current was investigated by means of Deep Level…”
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Switch-on overshoot transient decay mechanism in polycrystalline silicon thin-film transistors by Papaioannou, G. J., Exarchos, M., Kouvatsos, D. N., Voutsas, A. T.

“…The present work investigates the switch-on transient decay in polycrystalline thin-film transistors. The decay is found to follow the stretched exponential…”
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A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance by Moschou, Despina C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

“…Polysilicon TFTs fabricated in films crystallized with a novel SLS ELA technique were investigated. The TFT channels were oriented along the preferential…”
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The effect of generation–recombination mechanisms on the transient behavior of polycrystalline silicon transistors by Papaioannou, G.J., Voutsas, A., Exarchos, M., Kouvatsos, D.

“…We have investigated the switch-on transients of polycrystalline silicon thin film transistors. The investigation has been performed on devices fabricated on…”
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Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques by Moschou, D.C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

“…SLS ELA polysilicon TFTs fabricated in films crystallized with several novel techniques, yielding different film microstructure and texture, were investigated…”
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Investigation of charging mechanisms in metal-insulator-metal structures by Exarchos, M., Theonas, V., Pons, P., Papaioannou, G.J., Melle, S., Dubuc, D., Cocetti, F., Plana, R.

“…In this paper we have investigated the temperature dependence of the charging effects in Metal-Insulator-Metal structures, aiming to obtain a better insight on…”
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An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors by Michalas, L., Exarchos, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

“…The thermally activated mechanisms that determine the electrical properties of polycrystalline silicon thin film transistors have been investigated. The study…”
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Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique by Moschou, D.C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Arapoyanni, A., Voutsas, A.T.

“…SLS ELA n- and p-channel polysilicon TFTs fabricated with a novel technique were investigated, oriented both along the preferential and the non-preferential…”
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The impact of static and dynamic degradation on SOI “smart-cut” floating body MOSFETs by Exarchos, M.A., Papaioannou, G.J., Jomaah, J., Balestra, F.

“…The impact of static (DC) and dynamic (AC) degradation on SOI “smart-cut” floating body MOSFETs, was investigated by means of deep level transient spectroscopy…”
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On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs by EXARCHOS, M, DIEUDONNE, F, JOMAAH, J, PAPAIOANNOU, G. J, BALESTRA, F

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On the dielectric polarization effects in capacitive RF-MEMS switches by Papaioannou, G.J., Exarchos, M., Theonas, V., Wang, G., Papapolymerou, J.

“…This paper investigates both theoretically and experimentally the dielectric charging effects of capacitive RF MEMS switches. Dielectric charging caused by…”
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Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors by KOUVATSOS, D. N, DAVIDOVIC, V, PAPAIOANNOU, G. J, STOJADINOVIC, N, MICHALAS, L, EXARCHOS, M, VOUTSAS, A. T, GOUSTOURIDIS, D

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Effect of space charge polarization in radio frequency microelectromechanical system capacitive switch dielectric charging by Papaioannou, G. J., Exarchos, M., Theonas, V., Psychias, J., Konstantinidis, G., Vasilache, D., Muller, A., Neculoiu, D.

“…The letter presents the investigation of the temperature dependence of the charging mechanism of dielectric layer in radio frequency microelectromechanical…”
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Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs by Exarchos M., A., G.J., Papaioannou, Jomaah, J., Balestra, F.

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RF MEMS sensitivity to radiations by Papaioannou, G.J., Theonas, V., Exarchos, M., Konstantinidis, G.

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