Search Results - "Evseev, S.B."
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1
Amorphous silicon carbide nitride layer as an alternative to a disordered silicon surface to suppress RF/microwave losses
Published in Microelectronic engineering (01-08-2014)“…[Display omitted] •An alternative thermally-stable RF passivation method is presented.•The method relies on placing the surface currents in a high resistive…”
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Journal Article Conference Proceeding -
2
Eyring acceleration model in thick nitride/oxide dielectrics
Published in Microelectronics and reliability (01-04-2007)“…A kinetic model is developed, which can predict failure times in thick nitride/oxide dielectric stacks at elevated temperatures. It is shown that failure time…”
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Journal Article Conference Proceeding -
3
Ring-gate MOSFET test structures for measuring surface-charge-layer sheet resistance on high-resistivity-silicon substrates
Published in 2006 IEEE International Conference on Microelectronic Test Structures (2006)“…Ring-gate MOSFET test structures have been developed with which a differential measurement technique can be used to accurately determine the…”
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Conference Proceeding