Search Results - "Eung Taek Kim"
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A Separate Extraction Method for Asymmetric Source and Drain Resistances Using Frequency-Dispersive C - V Characteristics in Exfoliated MoS2 FET
Published in IEEE electron device letters (01-02-2016)“…Asymmetric source and drain (S/D) series resistances (R S and R D ) are unavoidable in exfoliated MoS 2 field-effect transistors (EM-FETs). Through combining…”
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A Separate Extraction Method for Asymmetric Source and Drain Resistances Using Frequency-Dispersive [Formula Omitted]-[Formula Omitted] Characteristics in Exfoliated MoS2 FET
Published in IEEE electron device letters (01-02-2016)“…Asymmetric source and drain (S/D) series resistances ([Formula Omitted] and [Formula Omitted]) are unavoidable in exfoliated MoS2 field-effect transistors…”
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Journal Article