Search Results - "Eung Taek Kim"

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    A Separate Extraction Method for Asymmetric Source and Drain Resistances Using Frequency-Dispersive C - V Characteristics in Exfoliated MoS2 FET by Hagyoul Bae, Choong-Ki Kim, Seung-Bae Jeon, Gwang Hyuk Shin, Eung Taek Kim, Jeong-Gyu Song, Youngjun Kim, Dong-Il Lee, Hyungjun Kim, Sung-Yool Choi, Kyung Cheol Choi, Yang-Kyu Choi

    Published in IEEE electron device letters (01-02-2016)
    “…Asymmetric source and drain (S/D) series resistances (R S and R D ) are unavoidable in exfoliated MoS 2 field-effect transistors (EM-FETs). Through combining…”
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    Journal Article
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