Search Results - "Erdmann, Christophe"

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    Comparison of High-Order Programmable Mismatch Shaping Bandpass DEM Implementations Applicable to Nyquist-Rate D/A Converters by Mehta, Shantanu, Pelliconi, Roberto, Erdmann, Christophe, O'Brien, Vincent, Mullane, Brendan

    “…Non-shaping dynamic element matching (DEM) randomization schemes are widely adopted for wideband Nyquist-rate digital-to-analog converters (DACs) within…”
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    Journal Article
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    An All-Programmable 16-nm RFSoC for Digital-RF Communications by Farley, Brendan, McGrath, John, Erdmann, Christophe

    Published in IEEE MICRO (01-03-2018)
    “…The Xilinx RFSoC is the first product to integrate cutting-edge RF data converters with an FPGA SoC. This breakthrough integration delivers a dramatic…”
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    Journal Article
  4. 4

    Optimal Driving Signal Extraction for Maximum Efficiency of Dual-Input High Power Amplifiers by Barradas, Filipe M., Nunes, Luis C., Pedro, Jose C., Erdmann, Christophe

    “…Dual-input single-output (DISO) radio frequency (RF) power amplifiers (PAs) have gathered significant interest for highly efficient amplification of modulated…”
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    Journal Article
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    A Robust Search Algorithm of Optimal Driving Signals for Dual-Input High Power Amplifiers by Barradas, Filipe M., Nunes, Luis C., Pedro, Jose C., Erdmann, Christophe

    “…This work proposes a robust algorithm to find the optimal driving signals of dual-input single-output Radio Frequency Power Amplifiers with minimal prior…”
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    Conference Proceeding
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    A 7.4-to-14GHz PLL with 54fsrms jitter in 16nm FinFET for integrated RF-data-converter SoCs by Turker, Didem, Bekele, Ade, Upadhyaya, Parag, Verbruggen, Bob, Ying Cao, Shaojun Ma, Erdmann, Christophe, Farley, Brendan, Frans, Yohan, Ken Chang

    “…Direct-RF data converters [1,2] have seen increased adoption in remote-radio-head TX and RX, due to their unparalleled bandwidth and flexibility. However,…”
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    Conference Proceeding
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    A Higher-Order Programmable Amplitude and Timing Error Shaping Bandpass DEM for Nyquist-Rate D/A Converters by Mehta, Shantanu, Mullane, Brendan, O'Brien, Vincent, Pelliconi, Roberto, Erdmann, Christophe

    “…This paper presents a programmable amplitude and timing error shaping bandpass dynamic- element-matching (DEM) for Nyquist-rate D/A converters. Amplitude and…”
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    Conference Proceeding
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    16.1 A 13b 4GS/s digitally assisted dynamic 3-stage asynchronous pipelined-SAR ADC by Vaz, Bruno, Lynam, Adrian, Verbruggen, Bob, Laraba, Asma, Mesadri, Conrado, Boumaalif, Ali, Mcgrath, John, Kamath, Umanath, De Le Torre, Ronnie, Manlapat, Alvin, Breathnach, Daire, Erdmann, Christophe, Farley, Brendan

    “…In recent years, the need for high performance RF sampling ADCs has driven impressive developments of pipelined-SAR and pipelined ADCs, all supported by…”
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    Conference Proceeding
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    A Wideband 6th Order Programmable Bandpass DEM Implementation for a Nyquist DAC by Mehta, Shantanu, Mullane, Brendan, O'Brien, Vincent, Pelliconi, Roberto, Erdmann, Christophe

    “…This paper presents a 6 th order programmable bandpass dynamic-element-matching (DEM) that shapes the static mismatch error of a Nyquist DAC for any choice of…”
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    Conference Proceeding
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    A programmable RFSoC in 16nm FinFET technology for wideband communications by Farley, Brendan, Boumaalif, Ali, Lynch, Patrick, Mesadri, Conrado, Melinn, David, Yap, Kwee Peng, Madden, Liam, Erdmann, Christophe, Vaz, Bruno, McGrath, John, Cullen, Edward, Verbruggen, Bob, Pelliconi, Roberto, Breathnach, Daire, Lim, Peng

    “…In this paper, we present a Programmable SoC device with monolithically integrated RF-ADCs and RF-DACs in a 16nm FinFET process. The device includes quad ARM…”
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    Conference Proceeding
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    Design and characterization of a high-precision resistor ladder test structure by Tuinhout, H.P., Hoogzaad, G., Vertregt, M., Roovers, R.L.J., Erdmann, C.

    “…A new subsite stepped multiresistor test structure is introduced. This test structure is used for studying and improving small resistance mismatch patterns in…”
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    Journal Article Conference Proceeding