Search Results - "Erdamar, A. K."

  • Showing 1 - 3 results of 3
Refine Results
  1. 1

    In situ transmission electron microscope formation of a single-crystalline Bi film on an amorphous substrate by Neklyudova, M., Sabater, C., Erdamar, A. K., van Ruitenbeek, J. M., Zandbergen, H. W.

    Published in Applied physics letters (06-03-2017)
    “…We have performed a range of in situ heating experiments of polycrystalline Bi films of 22–25 nm-thickness in a transmission electron microscope (TEM). This…”
    Get full text
    Journal Article
  2. 2

    Through-membrane electron-beam lithography for ultrathin membrane applications by Neklyudova, M., Erdamar, A. K., Vicarelli, L., Heerema, S. J., Rehfeldt, T., Pandraud, G., Kolahdouz, Z., Dekker, C., Zandbergen, H. W.

    Published in Applied physics letters (07-08-2017)
    “…We present a technique to fabricate ultrathin (down to 20 nm) uniform electron transparent windows at dedicated locations in a SiN membrane for in situ…”
    Get full text
    Journal Article
  3. 3

    Through-membrane electron-beam lithography for ultrathin membrane applications by Neklyudova, M, Erdamar, A. K, Vicarelli, L, Heerema, S. J, Rehfeldt, T, Pandraud, G, Kolahdouz, Z, Dekker, C, Zandbergen, H. W

    Published 13-09-2017
    “…Appl. Phys. Lett. 111, 063105 (2017) We present a technique to fabricate ultrathin (down to 20 nm) uniform electron transparent windows at dedicated locations…”
    Get full text
    Journal Article