Search Results - "Englisch, D"

  • Showing 1 - 4 results of 4
Refine Results
  1. 1

    Mesopic increment detection sensitivity, Part I: Phenomenological analysis by Englisch, D, Schiller, C, Bodrogi, P, Khanh, TQ

    “…Mesopic threshold detection sensitivity was investigated by projecting quasi-monochromatic incremental targets with 22 centroid wavelengths between 422 nm and…”
    Get full text
    Journal Article
  2. 2

    Mesopic increment detection sensitivity, Part 2: Modelling mesopic detection sensitivity by Englisch, D, Bodrogi, P, Schiller, C, Khanh, TQ

    “…This paper deals with the modelling of the mesopic detection sensitivity data described in Part 1. The modelling is based on a linear combination of the…”
    Get full text
    Journal Article
  3. 3

    Measurement of SET Injected Charge from a Californium-252 Source in 340 nm Straight and Enclosed Layout NMOS and PMOS Transistors by Englisch, D., Horstmann, M., Athanasiou, S., Jansen, R. J. E., Glass, B.

    “…The amount of irradiation SET injected charge into both the straight and ELT 340nm NMOS and PMOS transistor of a 180 nm Mixed-Mode CMOS technology has been…”
    Get full text
    Conference Proceeding
  4. 4