Search Results - "Eljarrat, A."

Electron energy loss spectroscopy on semiconductor heterostructures for optoelectronics and photonics applications by ELJARRAT, A., LÓPEZ‐CONESA, L., ESTRADÉ, S., PEIRÓ, F.

“…Summary In this work, we present characterization methods for the analysis of nanometer‐sized devices, based on silicon and III‐V nitride semiconductor…”
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Precessed electron beam electron energy loss spectroscopy of graphene: Beyond channelling effects by Yedra, Ll, Torruella, P., Eljarrat, A., Darbal, A. D., Weiss, J. K., Peiró, F., Estradé, S.

“…The effects of beam precession on the Electron Energy Loss Spectroscopy (EELS) signal of the carbon K edge in a 2 monolayer graphene sheet are studied. In a…”
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Extrinsic localized excitons in patterned 2D semiconductors by Yagodkin, D, Greben, K, Eljarrat, A, Kovalchuk, S, Ghorbani-Asl, M, Jain, M, Kretschmer, S, Severin, N, Rabe, J P, Krasheninnikov, A V, Koch, C T, Bolotin, K I

“…We demonstrate a new localized excitonic state in patterned monolayer 2D semiconductors. This state is not associated with lattice disorder but is extrinsic,…”
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