Search Results - "Eliseev, M. V."

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  1. 1

    Properties of electron field emission from a fractal surface by Isayeva, O.B., Eliseev, M.V., Rozhnev, A.G., Ryskin, N.M.

    Published in Solid-state electronics (01-06-2001)
    “…The results of a numerical simulation of electron field emission from the surface of 2-D fractal object bounded by a Julia set are presented. The calculations…”
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    Journal Article
  2. 2

    Guided and leaky modes of complex waveguide structures by Eliseev, M.V., Rozhnev, A.G., Manenkov, A.B.

    Published in Journal of lightwave technology (01-08-2005)
    “…The guided and leaky modes of the optical waveguides (fibers) are analyzed by the finite-element method (FEM) with the integral boundary conditions. The…”
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    Journal Article
  3. 3

    Analysis of leaky modes by a modified finite-element method by Eliseev, M. V., Manenkov, A. B., Rozhnev, A. G.

    “…The finite-element method with integral boundary conditions is used to investigate leaky modes (quasi-eigenmodes) of open dielectric waveguides. Dispersion…”
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    Journal Article
  4. 4

    Soft X-ray concentrators fabricated by the glass thermoplastic deformation technique by Pkhaiko, N. A., Gilev, O. N., Eliseev, M. V., Politov, V. Yu

    “…The technique of thermoplastic deformation of a glass has been adapted to the problem of fabrication of an axisymmetric X-ray concentrator. The FOKON-2…”
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    Journal Article
  5. 5

    The combined IEM-FEM method for calculation of properties of optical dielectric waveguides with arbitrary core near the cutoff by Eliseev, M.V., Rozhnev, A.G., Manenkov, A.B.

    “…The combined method of integral equation - finite elements (IEM-FEM) has been developed for calculation of optical dielectric waveguide properties. The method…”
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    Conference Proceeding
  6. 6

    A RKK-1-100 X-ray calibration facility by Gilev, O. N., Vikhlyaev, D. A., Eliseev, M. V., Ostashev, V. I., Potapov, A. V., Pronin, V. A., Pkhaiko, N. A., Shamraev, L. N.

    “…A RKK-1-100 automated X-ray calibration facility has been developed. This system allows studies of surfaces, near-surface layers, interfaces, and multilayer…”
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    Journal Article
  7. 7

    Numerical simulation of electron field emission from fractal surface by Eliseev, M.V., Isayeva, O.B., Rozhnev, A.G., Ryskin, N.M.

    “…Materials possessing significant emission ability in rather weak fields have great importance for vacuum microelectronics. From our point of view, the most…”
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    Conference Proceeding
  8. 8