11.5: A MEMS-based vacuum gauge for measuring pressure and out-gassing rates in miniaturized vacuum microelectronic devices

Cr/Au meander-shaped resistors were fabricated on 200nm thick square silicon nitride diaphragms on silicon with diaphragm dimensions of 0.775mm, 1.025mm, 1.275mm, 1.775mm, and 2.275mm. At 760Torr, the resistors were heated to about 20°C-60°C above ambient by Joules heating and the resistances were m...

Full description

Saved in:
Bibliographic Details
Published in:International Vacuum Nanoelectronics Conference pp. 215 - 216
Main Authors: Chang, J, Jayapratha, N, Kuljic, R, Salvador, B, Cantwell, M, Broughton, K, Kunzer, B, Po Keong Ng, Selner, A, Razo, R, Harris, M, Qilu He, Syerov, S, Harry, D, Kanneganti, S, Benison, A, Edlavitch, B, Dankovic, T, Banerjee, K, Feinerman, A, Busta, H
Format: Conference Proceeding
Language:English
Published: IEEE 01-07-2010
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Cr/Au meander-shaped resistors were fabricated on 200nm thick square silicon nitride diaphragms on silicon with diaphragm dimensions of 0.775mm, 1.025mm, 1.275mm, 1.775mm, and 2.275mm. At 760Torr, the resistors were heated to about 20°C-60°C above ambient by Joules heating and the resistances were monitored as a function of pressure from 760Torr to 2×10 -4 Torr. As expected from kinetic theory, the sensitivity of the gauges shifted from high to low pressure with increasing diaphragm size (distance from the heat source to the cold junction). Measurements were taken at powers ranging from 0.6mW to 6mW. The sensors were applied to measure potential vacuum bursts due to outgassing events in field emitters and to measure the pressure inside of glass capillaries.
ISBN:1424478898
9781424478897
ISSN:2164-2370
DOI:10.1109/IVNC.2010.5563229