Search Results - "EICKHOFF, Th"

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    Final state contribution to the Si 2p binding energy shift in SiO 2/Si(1 0 0) by Eickhoff, Th, Medicherla, V., Drube, W.

    “…The Si 1s and 2p photoemission and the Si KL 2,3L 2,3 Auger emission from SiO 2/Si(1 0 0) surfaces were measured for oxide thicknesses from 0.4 to 3.8 nm using…”
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    Journal Article
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    Test of dielectric–response model for energy and angular dependence of plasmon excitations in core-level photoemission by Yubero, F., Kover, L., Drube, W., Eickhoff, Th, Tougaard, S.

    Published in Surface science (01-11-2005)
    “…We compare experimental measurements of the loss structure appearing in the Si 2p and Si 1s photoemission lines for a large range of emission angles (between…”
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    Journal Article
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    Properties of the SiO2/SiC interface investigated by angle resolved studies of the Si 2p and Si 1s levels and the Si KLL Auger transitions by JOHANSSON, L. I, VIROJANADARA, C, EICKHOFF, Th, DRUBE, W

    Published in Surface science (10-04-2003)
    “…Angle resolved photoemission studies of the Si 2p and Si is core levels and the Si KL2,3L2,3 Auger transitions from SiO2/SiC samples are reported. Most samples…”
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    Journal Article
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    A comparative photoemission study of polar and nonpolar SiC surfaces oxidized in N 2O by Johansson, L.I, Virojanadara, C, Eickhoff, Th, Drube, W

    Published in Surface science (2004)
    “…Photoemission studies of oxidized SiC samples grown ex situ in N 2O, at a temperature of 900 °C, on the (0 0 0 1), (0 0 0 1̄), (1 1 2̄ 0) and (1 0 1̄ 0)…”
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    Journal Article
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    A comparative photoemission study of polar and nonpolar SiC surfaces oxidized in N2O by JOHANSSON, L. I, VIROJANADARA, C, EICKHOFF, Th, DRUBE, W

    Published in Surface science (10-03-2004)
    “…Photoemission studies of oxidized SiC samples grown ex situ in N 2O, at a temperature of 900 °C, on the (0001), (0001̄), (112̄0) and (101̄0) surfaces are…”
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    Journal Article
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    High energy photoemission investigations of SiO2/SiC samples by VIROJANADARA, C, GLANS, P.-A, JOHANSSON, L. I, EICKHOFF, Th, DRUBE, W

    Published in Applied surface science (15-03-2001)
    “…Chemically etched and directly load-locked SiO2/SiC samples are investigated using a photon energy of 3.0 keV. Si 2p and C 1s spectra recorded at different…”
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    Journal Article
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    High energy photoemission investigations of SiO 2/SiC samples by Virojanadara, C., Glans, P.-A., Johansson, L.I., Eickhoff, Th, Drube, W.

    Published in Applied surface science (2001)
    “…Chemically etched and directly load-locked SiO 2/SiC samples are investigated using a photon energy of 3.0 keV. Si 2p and C 1s spectra recorded at different…”
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    Journal Article
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    Characterization of SiO 2 layers thermally grown on 4H-SiC using high energy photoelectron spectroscopy by Johansson, L.I, Glans, P.-A, Wahab, Q, Grehk, T.M, Eickhoff, Th, Drube, W

    Published in Applied surface science (1999)
    “…Si 2p and C 1s core level spectra recorded at different electron emission angles from SiO 2/SiC samples using a photon energy of 3.0 keV show two components…”
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    Journal Article
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    Novel light-trapping schemes involving planar junctions and diffuse rear reflectors for thin-film silicon-based solar cells by Winz, K., Fortmann, C.M., Eickhoff, Th, Beneking, C., Wagner, H., Fujiwara, H., Shimizu, I.

    Published in Solar energy materials and solar cells (01-12-1997)
    “…Optical optimization of planar junction amorphous and microcrystalline silicon-based thin-film solar cells offers improved conversion efficiency. Planar…”
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    Journal Article
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    The influence of deeply-trapped charge on the transient photocurrent response of a-Si:H solar cells by Stannowski, B., Cordes, H., Brüggemann, R., Eickhoff, Th, Bröcheler, S., Wagner, H.

    Published in Journal of non-crystalline solids (01-01-1998)
    “…We investigated the transient photocurrent response of pin solar cells based on hydrogenated amorphous silicon to a step-wise switch-on of illumination. We…”
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    Journal Article
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    Optical optimization of a-Si:H solar cells using planar junctions and diffuse rear reflectors by Winz, K., Fortmann, C.M., Eickhoff, T., Wagner, H.

    “…Simple unoptimized planar junction amorphous silicon-based solar cells with TiO/sub 2/ based diffuse rear reflectors can obtain i-layer absorption similar to…”
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    Conference Proceeding
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    Smooth TCO/glass substrates and diffuse rear reflectors for efficient low cost amorphous silicon-based solar cells by Winz, K., Fortmann, C.M., Elckhoff, Th, Beneking, C., Rech, B., Kluth, O., Wagner, H.

    “…Improvements in amorphous silicon single junction solar cell stabilized performance can be realized by developing more stable materials as well as more…”
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    Conference Proceeding
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    Spectral response modelling of a-Si:H solar cells using accurate light absorption profiles by Stiebig, H., Kreisel, A., Winz, K., Schultz, N., Beneking, C., Eickhoff, Th, Wagner, H., Meer, M.

    “…An optical model calculating the generated carrier profile in a-Si:H solar cells deposited on hazy and nonhazy transparent conducting oxide (TCO) has been…”
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    Conference Proceeding
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    Transient photocurrent spectroscopy on amorphous silicon solar cells by Ulrichs, C., Eickhoff, T., Wagner, H.

    “…Transient photocurrent response measurements have been used to characterize deep level impurities in amorphous silicon solar cells. These measurements are…”
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    Conference Proceeding Journal Article
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    Integration of Porous Silicon Interference Filters in Si-Photodiodes by Kruiger, M., Berger, M.G., Marso, M., Thonissen, M., Hilbrich, S., Theib, W., Loo, R., Eickhoff, Th, Reetz, W., Grosse, P., Luth, H.

    “…A novel type of color-sensitive Si-photodiodes is presented Color-sensitivity is achieved by using porous silicon (PS) interference filters which were…”
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    Conference Proceeding
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    Pädagogische Professionalisierung zur Qualitätssicherung betrieblicher Bildung im Handwerk by Brücken, Michael, Eickhoff, Markus Th, Schaumann, Uwe, Schweers, Christoph

    “…Die Aus- und Weiterbildung im Handwerk ist in den letzten Jahren in vielen Lehrgängen und Prüfungen sowohl in ordnungspolitischer als auch in curricularer…”
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    Journal Article
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