Search Results - "Dziomba, Th"

Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams by Danzebrink, H. U., Dziomba, TH, Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L.

“…The near‐field probes described in this paper are based on metallized non‐contact atomic force microscope cantilevers made of silicon. For application in…”
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Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining by Lehrer, C., Frey, L., Petersen, S., Sulzbach, Th, Ohlsson, O., Dziomba, Th, Danzebrink, H.U., Ryssel, H.

“…Scanning near-field optical microscopy (SNOM) probes can be realized by aperture probes based on metal coated atomic force microscopy (AFM) sensors. The…”
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Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM) by Dziomba, Th, Sulzbach, Th, Ohlsson, O., Lehrer, Ch, Frey, L., Danzebrink, H. U.

“…We present aperture probes based on non‐contact silicon atomic force microscopy (AFM) cantilevers for simultaneous AFM and near‐infrared scanning near‐field…”
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