Search Results - "Dura, J. A"

Structural Characterization of the Voltage-Sensor Domain and Voltage-Gated K+-Channel Proteins Vectorially Oriented within a Single Bilayer Membrane at the Solid/Vapor and Solid/Liquid Interfaces via Neutron Interferometry by Gupta, S, Dura, J. A, Freites, J. A, Tobias, D. J, Blasie, J. K

“…The voltage-sensor domain (VSD) is a modular four-helix bundle component that confers voltage sensitivity to voltage-gated cation channels in biological…”
Get full text

Ultra-thin SiO2 on Si IX: absolute measurements of the amount of silicon oxide as a thickness of SiO2 on Si by Seah, M. P., Unger, W. E. S., Wang, Hai, Jordaan, W., Gross, Th, Dura, J. A., Moon, Dae Won, Totarong, P., Krumrey, M., Hauert, R., Zhiqiang, Mo

“…Results from a study conducted between National Metrology Institutes (NMIs) for the measurements of the absolute thicknesses of ultra‐thin layers of SiO2 on Si…”
Get full text

The effect of transverse wavefront width on specular neutron reflection by Majkrzak, C. F., Berk, N. F., Maranville, B. B., Dura, J. A., Jach, T.

“…In the analysis of neutron scattering measurements of condensed matter structure, it normally suffices to treat the incident and scattered neutron beams as if…”
Get full text

Insight on hydrogen injection and GdOx/Co interface chemistry from in operando neutron reflectometry and secondary ion mass spectrometry by Sheffels, S., Balakrishnan, P. P., Huang, M., Muramoto, S., Borchers, J. A., Dura, J. A., Grutter, A. J., Beach, G. S. D.

“…Ionic and redox control of magnetism can produce large changes to a variety of magnetic properties using a relatively small voltage. A model structure that…”
Get full text

Investigation of Hybrid Bilayer Membranes with Neutron Reflectometry:  Probing the Interactions of Melittin by Krueger, S, Meuse, C. W, Majkrzak, C. F, Dura, J. A, Berk, N. F, Tarek, M, Plant, A. L

“…Recent improvements in neutron reflectometry methodology have afforded enhanced sensitivity for the study of biomimetic membranes. The technique has been used…”
Get full text

Reversible Tuning of the Magnetic Exchange Coupling in Fe/V (001) Superlattices Using Hydrogen by Hjörvarsson, B., Dura, J. A., Isberg, P., Watanabe, T., Udovic, T. J., Andersson, G., Majkrzak, C. F.

“…The interlayer ordering between ferromagnetic Fe layers in Fe/V (001)superlattices is switched from initially parallel to antiparallel, as well as antiparallel…”
Get full text

First-Principles Determination of Hybrid Bilayer Membrane Structure by Phase-Sensitive Neutron Reflectometry by Majkrzak, C.F., Berk, N.F., Krueger, S., Dura, J.A., Tarek, M., Tobias, D., Silin, V., Meuse, C.W., Woodward, J., Plant, A.L.

“…The application of a new, phase-sensitive neutron reflectometry method to reveal the compositional depth profiles of biomimetic membranes is reported…”
Get full text

Magnetic Structure of Cr in Exchange Coupled Fe/Cr(001) Superlattices by Schreyer, A., Majkrzak, C. F., Zeidler, Th, Schmitte, T., Bödeker, P., Theis-Bröhl, K., Abromeit, A., Dura, J. A., Watanabe, T.

Get full text

Observation of Antiparallel Magnetic Order in Weakly Coupled Co/Cu Multilayers by Borchers, J. A., Dura, J. A., Unguris, J., Tulchinsky, D., Kelley, M. H., Majkrzak, C. F., Hsu, S. Y., Loloee, R., Pratt, W. P., Bass, J.

Get full text

Comparative thickness measurements of SiO2/Si films for thicknesses less than 10 nm by Jach, T., Dura, J. A., Nguyen, N. V., Swider, J., Cappello, G., Richter, C.

“…We report on a comparative measurement of SiO2/Si dielectric film thickness (t < 10 nm) using grazing‐incidence x‐ray photoelectron spectroscopy, neutron…”
Get full text

Neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry characterization of thin SiO2 on Si by Dura, J. A., Richter, C. A., Majkrzak, C. F., Nguyen, N. V.

“…We present here a comparison of neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry on a thin oxide film. These three probes each…”
Get full text

Neutron and X-ray reflectivity analysis of ceramic-metal materials by Gibaud, A., Sella, C., Maaza, M., Sung, L., Dura, J.A., Satija, S.K.

“…Neutron and X-ray reflectivity measurements of a thin film of cermet (ceramic-metal) made by co-sputtering Pt and Al 2O 3 on the surface of a flat piece of…”
Get full text

Asymmetric magnetization reversal in exchange-biased hysteresis loops by Fitzsimmons, MR, Yashar, P, Leighton, C, Schuller, IK, Nogues, J, Majkrzak, CF, Dura, JA

“…Polarized neutron reflectometry is used to probe the in-plane projection of the net-magnetization vector M--> of polycrystalline Fe films exchange coupled to…”
Get full text

Asymmetric Magnetization Reversal in Exchange-Biased Hysteresis Loops by Fitzsimmons, M. R., Yashar, P., Leighton, C., Schuller, Ivan K., Nogués, J., Majkrzak, C. F., Dura, J. A.

Get full text

Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study by Seah, M. P., Spencer, S. J., Bensebaa, F., Vickridge, I., Danzebrink, H., Krumrey, M., Gross, T., Oesterle, W., Wendler, E., Rheinländer, B., Azuma, Y., Kojima, I., Suzuki, N., Suzuki, M., Tanuma, S., Moon, D. W., Lee, H. J., Cho, Hyun Mo, Chen, H. Y., Wee, A. T. S., Osipowicz, T., Pan, J. S., Jordaan, W. A., Hauert, R., Klotz, U., van der Marel, C., Verheijen, M., Tamminga, Y., Jeynes, C., Bailey, P., Biswas, S., Falke, U., Nguyen, N. V., Chandler-Horowitz, D., Ehrstein, J. R., Muller, D., Dura, J. A.

“…Results are reported from a pilot study under the Consultative Committee for Amount of Substance (CCQM) to compare measurements of and resolve any relevant…”
Get full text

Phase determination and inversion in specular neutron reflectometry by Majkrzak, C.F., Berk, N.F., Dura, J.A., Satija, S.K., Karim, A., Pedulla, J., Deslattes, R.D.

“…We present results testing the experimental feasibility of recently discovered solutions of the dynamical phase problem for specular reflection. Using layers…”
Get full text

Epitaxial integration of single crystal C60 by DURA, J. A, PIPPENGER, P. M, HALAS, N. J, XIONG, X. Z, CHOW, P. C, MOSS, S. C

“…Single crystal thin films of (111) oriented C60 are grown on epitaxial layers of single crystal antimony. The C60/Sb epitaxy is confirmed by low-energy…”
Get full text

Anomalous lattice expansion of metal-hydrogen thin films by Miceli, P.F., Zabel, H., Dura, J.A., Flynn, C.P.

“…We report x-ray diffraction experiments investigating the lattice expansion due to hydrogen in Nb/Ta superlattices and thin Nb films. For low hydrogen…”
Get full text

Sb/GaSb heterostructures and multilayers by GOLDING, T. D, DURA, J. A, WANG, W. C, VIGLIANTE, A, MOSS, S. C, CHEN, H. C, MILLER, J. H, HOFFMAN, C. A, MEYER, J. R

“…We have successfully synthesized heterojunctions and elementary multilayered structures of the semimetal-semiconductor system Sb/GaSb using molecular beam and…”
Get full text

Diffusion of Selenium in Liquid-Phase Epitaxy–Grown Hg0.78Cd0.22Te by Zhao, W, Golding, T D, Littler, C L, Dinan, J H, Dura, J A, Lindstrom, R M

“…We present preliminary results on Se diffusion in liquid-phase epitaxy (LPE)-grown HgCdTe epilayers. The LPE Hg0.78Cd0.22Te samples were implanted with Se of…”
Get full text