Search Results - "Drevillon, B."

Recombination traffic in highly crystallized undoped microcrystalline Si films studied by steady state photoconductivity by Ram, Sanjay K., Kumar, Satyendra, Vanderhaghen, R., Drevillon, B., Rocca i Cabarrocas, P.

“…The dependences of photoconductivity ( σ ph) of highly crystallized dense undoped hydrogenated microcrystalline silicon (μc-Si:H) thin films on the temperature…”
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Monitoring critical dimensions of bidimensional gratings by spectroscopic ellipsometry and Mueller polarimetry by Foldyna, M., De Martino, A., Garcia-Caurel, E., Ossikovski, R., Bertin, F., Hazart, J., Postava, K., Drevillon, B.

“…In this work we characterized two bidimensional gratings consisting each of a square array of square holes etched in a photoresist layer deposited on silicon…”
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Optical characterisation of anatase: a comparative study of the bulk crystal and the polycrystalline thin film by Viseu, T.M.R., Almeida, B., Stchakovsky, M., Drevillon, B., Ferreira, M.I.C., Sousa, J.B.

“…The optical parameters of crystalline anatase and polycrystalline anatase films prepared by reactive magnetron sputtering were examined by spectroscopic…”
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Angle-resolved Mueller polarimeter using a microscope objective by Ben Hatit, S., Foldyna, M., De Martino, A., Drévillon, B.

“…A new Mueller polarimeter based on liquid crystals and a microscope objective is presented for the characterization of diffraction gratings in a conical…”
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An interfacial study of a hydrogenated carbon interlayer for adhesion enhancement of plasma deposited silica thin films on polycarbonate by Hofrichter, A., Bulkin, P., Drevillon, B.

“…This work presents a new plasma treatment for the adhesion enhancement of a plasma deposited silica layer to polycarbonate. After initial oxygen plasma…”
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Ellipsometric method for real time control of thin film deposition on imperfect substrates by Hofrichter, A., Heitz, T., Bulkin, P., Drevillon, B.

“…In this work we present a method of the ellipsometric control for optical filter deposition. This control procedure uses the length of the real time…”
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Spectroscopic Mueller polarimeter based on liquid crystal devices by Garcia-Caurel, E., De Martino, A., Drévillon, B.

“…A new spectroscopic Mueller matrix polarimeter based on liquid crystal devices is presented. Fast spectroscopic measurements (approx. 1 s) of a complete…”
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Real time monitoring of the growth of transparent thin films by spectroscopic ellipsometry by Kildemo, M., Drévillon, B.

“…Real time monitoring of the growth of plasma deposited transparent thin films by spectroscopic phase modulated ellipsometry (SPME) is presented. Two on-line…”
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Real time control of plasma deposited optical filters by multiwavelength ellipsometry by Heitz, T., Hofrichter, A., Bulkin, P., Drevillon, B.

“…Real time control of optical filters by multiwavelength ellipsometry is presented. The filters consist of SiO 2 / Si3N 4 multilayers deposited on transparent…”
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Surface modifications of polycarbonate (PC) and polyethylene terephtalate (PET) by cold remote nitrogen plasma (CRNP) by Jama, C., Dessaux, O., Goudmand, P., Mutel, B., Gengembre, L., Drevillon, B., Vallon, S., Grimblot, J.

“…Industrial PC and PET specimens have been treated by CRNP with pure N 2 or with N 2O 2 mixtures in order to modify their adhesion and surface properties…”
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General methods for optimized design and calibration of Mueller polarimeters by De Martino, A., Garcia-Caurel, E., Laude, B., Drévillon, B.

“…A Mueller polarimeter always comprises a polarization state generator (PSG) and a polarization state analyzer (PSA), whose configurations determine the…”
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Mueller polarimetric imaging system with liquid crystals by Laude-Boulesteix, Blandine, De Martino, Antonello, Drévillon, Bernard, Schwartz, Laurent

“…We present a new polarimetric imaging system based on liquid-crystal modulators, a spectrally filtered white-light source, and a CCD camera. The whole Mueller…”
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Time resolved microwave conductivity measurements for the characterization of transport properties in thin film micro-crystalline silicon by Brenot, R., Vanderhaghen, R., Drevillon, B., French, I., Roca i Cabarrocas, P.

“…The time resolved microwave conductivity (TRMC) technique measures the transient change in microwave reflectivity that carriers generated by a laser pulse…”
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In situ investigation of the optoelectronic properties of transparent conducting oxide/amorphous silicon interfaces by DREVILLON, B, SATYENDRA KUMAR, ROCI I CABARROCAS, P, SIEFERT, J. M

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Contactless electronic transport analysis of microcrystalline silicon by Brenot, R, Vanderhaghen, R, Drevillon, B, Mohammed-Brahim, T, Roca i Cabarrocas, P

“…Electronic transport of microcrystalline silicon is analyzed by diffusion-induced time resolved microwave conductivity (DTRMC), a new contactless method based…”
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Deposition of dielectrics using a matrix distributed electron cyclotron resonance plasma enhanced chemical vapor deposition system by Botha, R., Haj Ibrahim, B., Bulkin, P., Drévillon, B.

“…We have studied the deposition of silicon oxide, oxynitrides and silicon nitride in a novel, scalable, low-pressure high-density plasma system based on the ECR…”
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Plasma treatment of polycarbonate for improved adhesion by Hofrichter, A., Bulkin, P., Drévillon, B.

“…The deposition of silicon alloys for protective and optical coatings on polymers is of increasing interest. The understanding of the plasma polymer interaction…”
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In   situ investigation of amorphous silicon-silicon dioxide interfaces by infrared ellipsometry by Ossikovski, R., Shirai, H., Drévillon, B.

“…An in situ investigation of the a-Si:H-a-SiO2 interfaces by infrared phase modulated ellipsometry is presented. 20–30-Å-thick intermixing layers are clearly…”
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Substrate selectivity in the formation of microcrystalline silicon: Mechanisms and technological consequences by Roca i Cabarrocas, P., Layadi, N., Heitz, T., Drévillon, B., Solomon, I.

“…We report the results of an in situ spectroscopic ellipsometry study concerning the substrate dependence of the evolution of microcrystalline silicon films…”
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Determination of the composition and thickness of borophosphosilicate glass films by infrared ellipsometry by Ossikovski, R., Blayo, N., Drévillon, B., Firon, M., Delahaye, B., Mayeux, A.

“…A quantitative analysis of IR ellipsometry spectra of borophosphosilicate glass (BPSG) thin films deposited on silicon wafers is presented. The film thickness…”
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