Search Results - "Dresselhaus, J. L."

Precise wavefront characterization of X-ray optical elements using a laboratory source by Dresselhaus, J. L, Fleckenstein, H, Domaracky, M, Prasciolu, M, Ivanov, N, Carnis, J, Murray, K. T, Morgan, A. J, Chapman, H. N, Bajt, S

“…Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be…”
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Coherent X-ray diffraction with a convergent beam by Chapman, H. N., Bajt, S., Li, C., Ivanov, N., Dresselhaus, J. L., Zhang, W., Zakharova, M., Yefanov, O., Pateras, A., Fleckenstein, H., Prasciolu, M.

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Compton microscopy with multilayer Laue lenses by Bajt, S., Chapman, H. N., Li, T., Fleckenstein, H., Prasciolu, M., Dresselhaus, J. L., Ivanov, N., Yefanov, O., Zhang, W., Pennicard, D., Villanueva-Perez, P., Gutowski, O., Dippel, A.-C.

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