Search Results - "Doria, Rodrigo Trevisoli"

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  1. 1

    Junctionless Multiple-Gate Transistors for Analog Applications by Doria, R. T., Pavanello, M. A., Trevisoli, R. D., de Souza, M., Chi-Woo Lee, Ferain, I., Akhavan, N. D., Ran Yan, Razavi, P., Ran Yu, Kranti, A., Colinge, J.

    Published in IEEE transactions on electron devices (01-08-2011)
    “…This paper presents the evaluation of the analog properties of nMOS junctionless (JL) multigate transistors, comparing their performance with those exhibited…”
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    Journal Article
  2. 2

    Surface-Potential-Based Drain Current Analytical Model for Triple-Gate Junctionless Nanowire Transistors by Trevisoli, R. D., Doria, R. T., de Souza, M., Das, S., Ferain, I., Pavanello, M. A.

    Published in IEEE transactions on electron devices (01-12-2012)
    “…This paper proposes a drain current model for triple-gate n-type junctionless nanowire transistors. The model is based on the solution of the Poisson equation…”
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    Journal Article
  3. 3

    Analysis of the leakage current in junctionless nanowire transistors by Trevisoli, Renan, Trevisoli Doria, Rodrigo, de Souza, Michelly, Antonio Pavanello, Marcelo

    Published in Applied physics letters (11-11-2013)
    “…This letter presents an analysis of the leakage current in Junctionless Nanowire Transistors. The analysis is performed using experimental data together with…”
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    Journal Article
  4. 4

    Low-frequency noise of n-type triple gate FinFETs fabricated on standard and 45° rotated substrates by Doria, Rodrigo Trevisoli, Martino, João Antonio, Simoen, Eddy, Claeys, Cor, Pavanello, Marcelo Antonio

    Published in Solid-state electronics (01-12-2013)
    “…► Low-frequency noise analysis of 0° and 45° substrate rotated FinFETs is carried out. ► Substrate rotation has not affected the 1/f noise. ► Substrate…”
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    Journal Article Conference Proceeding
  5. 5

    Cross-coupling effects in common-source current mirrors composed by UTBB transistors by José da Costa, Fernando, Trevisoli, Renan, Trevisoli Doria, Rodrigo

    Published in Solid-state electronics (01-08-2022)
    “…•Study performed through 3D numerical simulations validated with experimental data.•Analysis of the coupling effects in current mirrors composed by UTBB as…”
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    Journal Article
  6. 6

    Substrate Bias Influence on the Operation of Junctionless Nanowire Transistors by Trevisoli, Renan, Trevisoli Doria, Rodrigo, de Souza, Michelly, Pavanello, Marcelo Antonio

    Published in IEEE transactions on electron devices (01-05-2014)
    “…The aim of this paper is to analyze the substrate bias influence on the operation of junctionless nanowire transistors based on 3-D simulated and experimental…”
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    Journal Article
  7. 7

    Analytical Model for the Dynamic Behavior of Triple-Gate Junctionless Nanowire Transistors by Trevisoli, Renan, Trevisoli Doria, Rodrigo, de Souza, Michelly, Barraud, Sylvain, Vinet, Maud, Pavanello, Marcelo Antonio

    Published in IEEE transactions on electron devices (01-02-2016)
    “…This paper presents an analytical model for the intrinsic capacitances and transconductances of triple-gate junctionless nanowire transistors. The model is…”
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    Journal Article
  8. 8

    A New Method for Series Resistance Extraction of Nanometer MOSFETs by Trevisoli, Renan, Trevisoli Doria, Rodrigo, de Souza, Michelly, Barraud, Sylvain, Vinet, Maud, Casse, Mikael, Reimbold, Gilles, Faynot, Olivier, Ghibaudo, Gerard, Pavanello, Marcelo Antonio

    Published in IEEE transactions on electron devices (01-07-2017)
    “…This paper presents a new method for the series resistance extraction in ultimate MOSFETs using a single drain current versus gate voltage characteristic…”
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    Journal Article
  9. 9

    Analysis of Standard-MOS and Ultra-Low-Power Diodes Composed by SOI UTBB Transistors by Costa, Fernando Jose da, Trevisoli, Renan, Doria, Rodrigo Trevisoli

    “…The main objective of this work is to present an analysis of the performance of Ultra-Thin-Body and Buried Oxide transistors working as Ultra-Low-Power and…”
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    Journal Article
  10. 10

    A physically-based threshold voltage definition, extraction and analytical model for junctionless nanowire transistors by Trevisoli, Renan Doria, Doria, Rodrigo Trevisoli, de Souza, Michelly, Pavanello, Marcelo Antonio

    Published in Solid-state electronics (01-12-2013)
    “…► The equality of the drift and diffusion components of the drain current was defined as threshold condition. ► A methodology for the threshold voltage…”
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    Journal Article Conference Proceeding
  11. 11

    The zero temperature coefficient in junctionless nanowire transistors by Trevisoli, Renan Doria, Doria, Rodrigo Trevisoli, Souza, Michelly de, Das, Samaresh, Ferain, Isabelle, Pavanello, Marcelo Antonio

    Published in Applied physics letters (06-08-2012)
    “…This Letter presents an analysis of the zero temperature coefficient (ZTC) bias in junctionless nanowire transistors (JNTs). Unlike in previous works, which…”
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    Journal Article
  12. 12

    Harmonic distortion of 2-MOS structures for MOSFET-C filters implemented with n-type unstrained and strained FINFETS by Doria, Rodrigo Trevisoli, Simoen, Eddy, Claeys, Cor, Martino, João Antonio, Pavanello, Marcelo Antonio

    Published in Solid-state electronics (01-08-2011)
    “…► HD3 of 2-MOS structures composed by FinFETs reduces with the raise of the gate bias. ► HD3 reduction is more pronounced in narrower and longer devices. ► HD3…”
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    Journal Article
  13. 13

    Modeling the interface traps-related low frequency noise in triple-gate SOI junctionless nanowire transistors by Trevisoli, Renan, Doria, Rodrigo Trevisoli, Barraud, Sylvain, Pavanello, Marcelo Antonio

    Published in Microelectronic engineering (15-07-2019)
    “…The aim of this work is to propose a semi-analytical model for the low frequency noise caused by interface traps in Triple-Gate Junctionless Nanowire…”
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    Journal Article
  14. 14

    Analytical Model for Low-Frequency Noise in Junctionless Nanowire Transistors by Trevisoli, Renan, Pavanello, Marcelo Antonio, Capovilla, Carlos Eduardo, Barraud, Sylvain, Doria, Rodrigo Trevisoli

    Published in IEEE transactions on electron devices (01-06-2020)
    “…This article aims at proposing a compact analytical model for the low-frequency noise (LFN) of junctionless nanowire transistors (JNTs), operating at different…”
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    Journal Article
  15. 15

    Non-linearity analysis of triple gate SOI nanowires MOSFETS by Cardoso Paz, Bruna, Trevisoli Doria, Rodrigo, Casse, Mikael, Barraud, Sylvain, Reimbold, Gilles, Vinet, Maud, Faynot, Olivier, Pavanello, Marcelo Antonio

    “…This work aims to explore the harmonic distortion of triple gate SOI nanowires MOSFETs, considering long channel devices operating in saturation regime as…”
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    Conference Proceeding
  16. 16

    On the improvement of DC analog characteristics of FD SOI transistors by using asymmetric self-cascode configuration by de Souza, Michelly, Flandre, Denis, Doria, Rodrigo Trevisoli, Trevisoli, Renan, Pavanello, Marcelo Antonio

    Published in Solid-state electronics (01-03-2016)
    “…This paper demonstrates the improvement of DC analog performance of FD SOI transistors provided by the adoption of asymmetric self-cascode (A-SC)…”
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    Journal Article
  17. 17

    Compact modeling of triple gate junctionless MOSFETs for accurate circuit design in a wide temperature range by Pavanello, Marcelo Antonio, Cerdeira, Antonio, Doria, Rodrigo Trevisoli, Ribeiro, Thales Augusto, Ávila-Herrera, Fernando, Estrada, Magali

    Published in Solid-state electronics (01-09-2019)
    “…This paper presents the extension of proposed physically-based continuous compact analytical model of triple gate junctionless nanowire transistors for…”
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    Journal Article
  18. 18

    Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization by Doria, Rodrigo Trevisoli, Trevisoli, Renan, de Souza, Michelly, Barraud, Sylvain, Vinet, Maud, Faynot, Olivier, Pavanello, Marcelo Antonio

    Published in Microelectronic engineering (25-06-2017)
    “…This work presents, for the first time, an experimental analysis of the low-frequency noise and the effective trap density dependence of junctionless nanowire…”
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    Journal Article
  19. 19

    Extraction of the interface trap density energetic distribution in SOI Junctionless Nanowire Transistors by Trevisoli, Renan, Doria, Rodrigo Trevisoli, de Souza, Michelly, Pavanello, Marcelo Antonio

    Published in Microelectronic engineering (01-11-2015)
    “…This work proposes a method for extracting the energetic distribution of the interface trap density at the gate dielectric in Junctionless silicon Nanowire…”
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    Journal Article
  20. 20

    Analysis of harmonic distortion of asymmetric self-cascode association of SOI nMOSFETs operating in saturation by d'Oliveira, Ligia Martins, Trevisoli Doria, Rodrigo, Pavanello, Marcelo A., de Souza, Michelly, Flandre, Denis

    “…This paper presents an experimental analysis of the harmonic distortion of asymmetric self-cascode (A-SC) association of SOI transistors. This goal is achieved…”
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    Conference Proceeding