Search Results - "Donohue, Tom"

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  1. 1
    X-ray lithography for ⩽ 100  nm ground rules in complex patterns

    X-ray lithography for ⩽ 100  nm ground rules in complex patterns by Hector, Scott, Pol, Victor, Krasnoperova, Azalia, Maldonado, Juan, Flamholz, Alex, Heald, Dave, Stahlhammer, Carl, Galburt, Dan, Amodeo, Ralph, Donohue, Tom, Wind, Shalom, Buchigniano, James, Viswanathan, Raman, Khan, Mumit, Bollepalli, Srinivas, Cerrina, Franco

    “…Complex patterns with 75–125 nm feature sizes exposed with x-ray lithography are shown. Lithographic results for 75–125 nm lines with varying pitch are…”
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    Conference Proceeding
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  2. 2
    Trade abroad, investment at home

    Trade abroad, investment at home by Donohue, Tom

    Published in The Hill (Washington, D.C.) (20-01-2010)
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    Newspaper Article
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