Search Results - "Doi, Takahisa"

Diffraction microscopy using 20kV electron beam for multiwall carbon nanotubes by Kamimura, Osamu, Kawahara, Kota, Doi, Takahisa, Dobashi, Takashi, Abe, Takashi, Gohara, Kazutoshi

“…Diffraction microscopy with iterative phase retrieval using a 20kV electron beam was carried out to explore the possibility of high-resolution imaging for…”
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Stable structures of a Si( [formula omitted]) vicinal surface after alternating current heating up to about 1140 °C by Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki

“…The topography of a Si(0 0 1) vicinal surface is investigated by using reflection electron microscopy after alternating current (AC) heating at temperatures up…”
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High-temperature MBE growth of Si-Direct current heating effects on (111) and (001) vicinal surfaces by STOYANOV, S. S, ICHIKAWA, M, DOI, T

“…The molecular beam epitaxial (MBE) growth model is extended to account for the electromigration of Si adatoms on both (001) and (111) Si surfaces. Step…”
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Formation of double-monolayer-height islands on a Si(001) surface by alternating current heating in molecular beam epitaxy by Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki, Kakibayashi, Hiroshi

“…Molecular beam epitaxy (MBE) of Si atoms onto a Si(001) 1×2 surface is investigated using reflection electron microscopy. A 1×2 surface with wide 1×2 and…”
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Activation energies of Si adsorbate diffusion on a Si(001) surface by Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki, Ninomiya, Ken

“…The diffusion of Si adsorbates deposited on a Si(001) surface is studied by a reflection electron microscope (REM). The diffusion constants are obtained from…”
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The driving force of Si adsorbate transfer on a Si(001) surface by Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki

“…The driving force of Si adsorbates deposited on a Si(001) surface is investigated by reflection electron microscopy. When the sample is heated by direct…”
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Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes by Kamimura, Osamu, Doi, Takahisa, Dobashi, Takashi, Kawahara, Kota, Abe, Takashi, Gohara, Kazutoshi

“…Diffraction microscopy with iterative phase retrieval using a 20 kV electron beam was carried out to explore the possibility of high-resolution imaging for…”
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Direct observation of electron charge of Si atoms on a Si(001) surface by DOI, T, ICHIKAWA, M

“…The electron charge of Si adsorbates evaporated on a Si(001)-2×1 surface is studied by tracing their behavior after heating of the substrate. A reflection…”
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Thermal properties of anisotropic diffusion of Si adsorbates on a Si(001) surface by Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki, Ninomiya, Ken

“…The diffusion of Si adsorbates deposited on a Si(001) clean surface is investigated by using a reflection electron microscope (REM). When the sample is heated…”
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Migration of a Si microcluster due to the electron wind on a Si(001) surface by Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki, Ninomiya, Ken

“…At a high temperature of about 1500 K, the migration of a Si microcluster was observed on a Si(001) surface by using an electron microscope. This cluster…”
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Anisotropic diffusion of Si adsorbates on a Si(001) surface by DOI, T, ICHIKAWA, M

“…The behavior of Si adsorbates evaporated on a Si(001) surface is studied by tracing their diffusion caused by radiative heating. A reflection electron…”
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Possibility of a new phase transition in 7×7 structure on clean Si(111) surfaces by ISHIZAKA, A, DOI, T, ICHIKAWA, M

“…Temperature dependences of reflection high-energy electron diffraction intensities are measured for Si(111)-7×7 clean surfaces. The temperature dependences of…”
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Diffusion constants of Si adsorbates on a Si(001) surface by DOI, T, ICHIKAWA, M, HOSOKI, S, NINOMIYA, K

“…The thermal diffusion of Si adsorbates deposited on a Si(001) clean surface was investigated using reflection electron microscopy. When the Si sample was…”
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Observation of Si(001) surface domains in absorption current images of an electron microscope by DOI, T, ICHIKAWA, M, HOSOKI, S

“…We investigated a Si(001) surface by scanning electron microscopy when an electron beam was incident at grazing angles on it. The absorption current images…”
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Observation of 1-nm-high structures on a Si(001) surface using a differential interference optical microscope by DOI, T, ISHIZAKA, A, ICHIKAWA, M, HOSOKI, S, NINOMIYA, K

“…A Si(001) clean surface is oxidized by exposure to air and the step-band structures on the oxidized surface are observed using a differential interference…”
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Observation of Si(001) surface topography at temperatures below 1140t°C using a reflection electron microscope by Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki

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Observation of surface micro-structures by micro-probe reflection high-energy electron diffraction by ICHIKAWA, M, DOI, T, ICHIHASHI, M, HAYAKAWA, K

“…A new micro-probe reflection high-energy electron diffraction technique has been developed for observing micro-structures on crystal surfaces. In this…”
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Diffraction microscopy using 20 kV electron beam for multiwallcarbon nanotubes by Kamimura, Osamu, Kawahara, Kota, Doi, Takahisa, Dobashi, Takashi, Abe, Takashi, Gohara, Kazutoshi

“…Diffraction microscopy with iterative phase retrieval using a 20 kV electron beam was carried out to explore the possibility of high-resolution imaging for…”
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Anisotropic diffusion between the step-up and the step-down directions on a Si(001) surface by Doi, T, Ichikawa, M, Hosoki, S, Ninomiya, K

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High dose rate effect of focused-ion-beam boron implantation into silicon by TAMURA, M, SHUKURI, S, ISHITANI, T, ICHIKAWA, M, DOI, T

“…The effect of high-dose-rate, 16 keV focused-ion-beam (FIB) B + implantation into Si has been investigated as a function of current density and beam-scan…”
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