Search Results - "Dhar, N K"
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1
3D far-field Lidar sensing and computational modeling for human identification
Published in Applied optics. Optical technology and biomedical optics (10-03-2024)“…3D sensors offer depth sensing that may be used for task-specific data processing and computational modeling. Many existing methods for human identification…”
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2
Modeling of LWIR HgCdTe Auger-Suppressed Infrared Photodiodes under Nonequilibrium Operation
Published in Journal of electronic materials (01-09-2008)“…The general approach and effects of nonequilibrium operation of Auger-suppressed HgCdTe infrared photodiodes are well understood. However, the complex…”
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Journal Article Conference Proceeding -
3
MBE growth of CdSeTe/Si composite substrate for long-wavelength IR HgCdTe applications
Published in Journal of crystal growth (01-05-2003)“…For the first time, the ternary alloy CdSe x Te 1− x (2 1 1) has been grown on Si(2 1 1) substrates using molecular beam epitaxy. The growth of CdSeTe was…”
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4
Status of LWIR HgCdTe-on-Silicon FPA Technology
Published in Journal of electronic materials (01-09-2008)“…The use of silicon as an alternative substrate to bulk CdZnTe for epitaxial growth of HgCdTe for infrared detector applications is attractive because of…”
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5
Role of dislocation scattering on the electron mobility of n-type long wave length infrared HgCdTe on silicon
Published in Journal of electronic materials (01-08-2007)“…It has been reported that the basic electrical properties of n-type long wave length infrared (LWIR) HgCdTe grown on silicon, including the majority carrier…”
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6
Nucleation of ZnTe/CdTe epitaxy on high-miller-index Si surfaces
Published in Journal of electronic materials (01-07-2003)“…Tellurium-adsorption studies were conducted on {111}-type Si surfaces that are off-cut from the {111} in the range of 0-30DG on both nonpassivated- and…”
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7
Molecular beam epitaxial growth and characterization of Cd-based II-VI wide-bandgap compounds on Si substrates
Published in Journal of electronic materials (01-05-2005)“…We have carried out a detailed study on the growth of Cd-based II-VI compounds on Si substrates using molecular beam epitaxy (MBE). CdTe, CdSe, CdSeTe, and…”
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8
LWIR HgCdTe on Si detector performance and analysis
Published in Journal of electronic materials (01-06-2006)“…We have fabricated a series of 256 pixel × 256 pixel, 40 µm pitch LWIR focal plane arrays (FPAs) with HgCdTe grown on (211) silicon substrates using MBE grown…”
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Conference Proceeding Journal Article -
9
Molecular beam epitaxy grown long wavelength infrared HgCdTe on Si detector performance
Published in Journal of electronic materials (01-06-2005)“…The use of silicon as a substrate alternative to bulk CdZnTe for epitaxial growth of HgCdTe for infrared (IR) detector applications is attractive because of…”
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Conference Proceeding Journal Article -
10
Long wavelength infrared, molecular beam epitaxy, HgCdTe-on-Si diode performance
Published in Journal of electronic materials (01-06-2004)“…In the past several years, we have made significant progress in the growth of CdTe buffer layers on Si wafers using molecular beam epitaxy (MBE) as well as the…”
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11
MBE growth and device processing of MWIR HgCdTe on large area Si substrates
Published in Journal of electronic materials (01-06-2001)“…The traditional substrate of choice for HgCdTe material growth has been lattice matched bulk CdZnTe material. However, as larger array sizes are required for…”
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12
Molecular beam epitaxial growth of Cd1-yZnySexTe1-x on Si(211)
Published in Journal of electronic materials (01-06-2004)“…We report on the first successful growth of the quaternary alloy Cd1-yZnySexTe1-x(211) on 3-in. Si(211) substrates using molecular beam epitaxy (MBE). The…”
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13
Molecular-beam epitaxial growth of CdsexTe1-x on Si(211)
Published in Journal of electronic materials (01-07-2003)“…We report on the first successful growth of the ternary-alloy CdSexTe1-x(211) on 3-in. Si(211) substrates using molecular-beam epitaxy (MBE). The growth of…”
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Conference Proceeding Journal Article -
14
Monolithically integrated HgCdTe focal plane arrays
Published in Journal of electronic materials (01-06-2005)“…The cost and performance of hybrid HgCdTe infrared (IR) focal plane arrays are constrained by the necessity of fabricating the detector arrays on a CdZnTe…”
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15
High-Performance MWIR HgCdTe on Si Substrate Focal Plane Array Development
Published in Journal of electronic materials (01-09-2015)“…The development of low noise-equivalent differential temperature (NEDT), high-operability midwave infrared (MWIR) focal plane arrays (FPAs) fabricated from…”
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16
Heteroepitaxy of CdTe on {211}Si substrates by molecular beam epitaxy
Published in Journal of crystal growth (01-02-1996)“…Direct growth of (211)CdTe on Si has been achieved by molecular beam epitaxy. We adopted techniques for substrate preparation that do not require heating above…”
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Journal Article Conference Proceeding -
17
Variable area MWIR diodes on HgCdTe/Si grown by molecular beam epitaxy
Published in Journal of electronic materials (01-06-2000)“…Molecular beam epitaxy technique has been used to grow double layer heterostructure mercury cadmium telluride materials on silicon substrates for infrared…”
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18
Enhanced Photon Absorption in Subwavelength Mercury Cadmium Telluride Layer for Infrared Detectors Operating at Higher Temperature
Published in 2023 IEEE Photonics Conference (IPC) (12-11-2023)“…Enhancement of incident photon absorption in a subwavelength thick Mercury-Cadmium-Telluride (Hg 1-x Cd x Te, MCT) has been numerically analyzed in the MWIR…”
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Conference Proceeding -
19
HgCdTe heteroepitaxy on three-inch (112) CdZnTe/Si: Ellipsometric control of substrate temperature
Published in Journal of electronic materials (01-06-2000)“…The technique of spectroscopic ellipsometry (SE) has been utilized to monitor in real-time and precisely control the surface temperature of Hg sub(1-x)Cd…”
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20
Analysis of Dislocation Density in Pb(1−x)SnxSe Grown on ZnTe/Si by MBE
Published in Journal of electronic materials (2009)“…The growth of (211) Pb (1− x ) Sn x Se on Si is achieved with a thick ZnTe buffer layer. The obtained films are specular, but contain widely dispersed void…”
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