Search Results - "Deline, V. R."

Refine Results
  1. 1

    Mechanism for bistability in organic memory elements by Bozano, L. D., Kean, B. W., Deline, V. R., Salem, J. R., Scott, J. C.

    Published in Applied physics letters (26-01-2004)
    “…We demonstrate that the resistive switching phenomenon observed in organic semiconductor layers containing granular metal particles conforms to a charge…”
    Get full text
    Journal Article
  2. 2

    Surface-induced orientation of symmetric, diblock copolymers: a secondary ion mass-spectrometry study by Coulon, G, Russell, T. P, Deline, V. R, Green, P. F

    Published in Macromolecules (01-06-1989)
    “…Secondary ion mass spectrometry, SIMS, has been used to investigate a surface-induced orientation of symmetric, diblock polystyrene/poly(methyl methacrylate)…”
    Get full text
    Journal Article
  3. 3
  4. 4

    Evidence for segregation of Te in Ge2Sb2Te5 films: Effect on the “phase-change” stress by Krusin-Elbaum, L., Cabral, C., Chen, K. N., Copel, M., Abraham, D. W., Reuter, K. B., Rossnagel, S. M., Bruley, J., Deline, V. R.

    Published in Applied physics letters (02-04-2007)
    “…The authors present direct evidence for Te segregation to the grain boundaries in chalcogenide Ge2Sb2Te5 films by using transmission electron microscopy scans…”
    Get full text
    Journal Article
  5. 5

    Influence of Chain Entanglement on the Failure Modes in Block Copolymer Toughened Interfaces by Creton, C, Brown, H. R, Deline, V. R

    Published in Macromolecules (01-03-1994)
    “…We have investigated the toughness and failure mechanism of the interface between poly-(methyl methacrylate) (PMMA) and poly(phenylene oxide) (PPO)…”
    Get full text
    Journal Article
  6. 6

    Direct observation of reptation at polymer interfaces by Russell, T. P, Deline, V. R, Dozier, W. D, Felcher, G. P, Agrawal, G, Wool, R. P, Mays, J. W

    Published in Nature (London) (16-09-1993)
    “…Observations of the reptation of molecules across the interface between two types of partially deuterated polystyrene polymers are described. Results show that…”
    Get full text
    Journal Article
  7. 7

    Evidence for cleavage of polymer chains by crack propagation by Brown, H. R, Deline, V. R, Green, P. F

    Published in Nature (London) (21-09-1989)
    “…Crack propagation in polymers is a topic of considerable importance to the technological application of these materials. Research suggests means by which the…”
    Get full text
    Journal Article
  8. 8

    Block Copolymer Mixtures As Revealed By Neutron Reflectivity by Mayes, A. M, Russell, T. P, Deline, V. R, Satija, S. K, Majkrzak, C. F

    Published in Macromolecules (01-12-1994)
    “…Thin film mixtures of high and low molecular weight symmetric poly(styrene-b-methyl methacrylate) diblock copolymers were investigated by neutron reflectivity…”
    Get full text
    Journal Article
  9. 9

    Characterization of Volatile Species Formed during Exposure of Photoresists to Ultraviolet Light by Houle, F. A, Deline, V. R, Truong, H, Sooriyakumaran, R

    Published in Macromolecules (16-10-2007)
    “…A photochemical path for formation of volatile S and acidolytic paths for formation of volatile Si and/or C during exposure to ultraviolet light have been…”
    Get full text
    Journal Article
  10. 10
  11. 11

    Hairpin configurations of triblock copolymers at homopolymer interfaces by Russell, T. P, Mayes, A. M, Deline, V. R, Chung, T. C

    Published in Macromolecules (01-10-1992)
    “…The organization of triblock copolymers containing a central block of polystyrene (PS) and two outer blocks of poly(methyl methacrylate)(PMMA), denoted…”
    Get full text
    Journal Article
  12. 12
  13. 13
  14. 14

    Reduction of electron and hole trapping in SiO2 by rapid thermal annealing by WEINBERG, Z. A, YOUNG, D. R, CALISE, J. A, COHEN, S. A, DELUCA, J. C, DELINE, V. R

    Published in Applied physics letters (01-12-1984)
    “…Reduction of electron or hole trapping in SiO2 was achieved by short-time lamp annealing. The trapping characterization was done by the avalanche injection…”
    Get full text
    Journal Article
  15. 15

    Mechanism of the SIMS matrix effect by Deline, V. R., Katz, William, Evans, C. A., Williams, Peter

    Published in Applied physics letters (01-11-1978)
    “…Quantization of ion microprobe mass spectrometric analyses has been complicated by the variation in the ion yield of an element contained in different…”
    Get full text
    Journal Article
  16. 16

    Lubricant migration in particulate magnetic recording media by Lorenz, M.R., Novotny, V.J., Deline, V.R.

    Published in IEEE transactions on magnetics (01-11-1991)
    “…Migration of lubricant from the porous magnetic coating and underlayer to the surface in particulate magnetic recording media is studied by dynamic secondary…”
    Get full text
    Journal Article
  17. 17

    Depth distributions and range parameters for He implanted in Si and GaAs by Wilson, R. G., Deline, V. R., Hopkins, C. G.

    Published in Applied physics letters (15-11-1982)
    “…Depth distributions for He implanted in Si and GaAs measured by secondary ion mass spectrometry (SIMS) are reported as a function of ion energy from 20 to 300…”
    Get full text
    Journal Article
  18. 18

    Investigation of transient diffusion effects in rapid thermally processed ion implanted arsenic in silicon by SEDGWICK, T. O, MICHEL, A. E, COHEN, S. A, DELINE, V. R, OEHRLEIN, G. S

    Published in Applied physics letters (01-01-1985)
    “…Arsenic dopant profile motion in ion implanted Si samples annealed for a few seconds at 1100 °C is adequately described by a model involving concentration…”
    Get full text
    Journal Article
  19. 19

    Rapid thermal annealing of boron-implanted silicon using an ultrahigh power arc lamp by HODGSON, R. T, DELINE, V. R, MADER, S, GELPEY, J. C

    Published in Applied physics letters (01-01-1984)
    “…We have used an ultrahigh powered, 100-kW vortex cooled arc lamp to anneal 75-mm-diam 〈100〉 silicon wafers implanted with various doses of 50-keV B+ and BF+2…”
    Get full text
    Journal Article
  20. 20

    Microstructure and properties of dual ion beam sputtered tungsten film by Kao, A. S., Hwang, C., Novotny, V. J., Deline, V. R., Gorman, G. L.

    “…The relationship between microstructure and properties of dual ion beam sputtered tungsten film is investigated. Film properties, such as electrical…”
    Get full text
    Journal Article