Search Results - "Delaney, M.J."
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1
On the use of intensity optical pumping and coherent population trapping techniques in the implementation of atomic frequency standards
Published in IEEE transactions on instrumentation and measurement (01-06-2003)“…The paper summarizes the relative advantages and disadvantages of coherent population trapping (CPT) or intensity optical pumping (IOP) for the implementation…”
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2
Practical realization of a passive coherent population trapping frequency standard
Published in IEEE transactions on instrumentation and measurement (01-12-2005)“…The paper outlines the practical realization and characteristics of a small, totally autonomous passive frequency standard based on the coherent population…”
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3
The coherent population trapping passive frequency standard [Rb example]
Published in IEEE transactions on instrumentation and measurement (01-04-2003)“…Coherent population trapping in alkali atoms has opened a new avenue in the implementation of atomic frequency standards having promising characteristics for…”
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4
High-performance submicrometer AlInAs-GaInAs HEMT's
Published in IEEE electron device letters (01-01-1988)“…The performance of long (1.3- mu m) and short (0.3- mu m) gate-length Al/sub 0.48/In/sub 0.52/ As-Ga/sub 0.47/In/sub 0.53/ high-electron-mobility transistors…”
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5
AlInAs-GaInAs HEMT for microwave and millimeter-wave applications
Published in IEEE transactions on microwave theory and techniques (01-09-1989)“…The status of lattice-matched high-electron-mobility transistors (HEMTs) and pseudomorphic AlInAs-GaInAs grown on In substrates is reviewed. The best…”
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6
Low-temperature buffer GaAs MESFET technology for high-speed integrated circuit applications
Published in IEEE electron device letters (01-08-1989)“…The fabrication of high-performance digital integrated circuits with low-temperature buffer (LTB) GaAs MESFET technology is presented. Individual 0.2- mu…”
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Robust Broadband (4 GHz - 16 GHz) GaN MMIC LNA
Published in 2007 IEEE Compound Semiconductor Integrated Circuits Symposium (01-10-2007)“…We report robust GaN MMIC LNA operating over 4 GHz-6 GHz frequency range. An FET biased in common-drain configuration is used on the second stage of the MMIC…”
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8
Ka-band MMIC power amplifier in GaN HFET technology
Published in 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) (2004)“…We report the development of Ka-band GaN MMIC power amplifiers in CPW and microstrip topologies. This is, to the best of our knowledge, the first demonstration…”
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9
Ka-band InP high electron mobility transistor monolithic microwave integrated circuit reliability
Published in Microelectronics and reliability (01-08-2001)“…The reliability of AlInAs/GaInAs high electron mobility transistor (HEMT) monolithic microwave integrated circuits on InP substrates from HRL Labs has been…”
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10
AlInAs/GaInAs HEMTs and HBTs for high speed circuits
Published in 1990 IEEE International Symposium on Circuits and Systems (ISCAS) (1990)“…High electron mobility transistors (HEMTs) and heterojunction bipolar transistors (HBTs) fabricated in the AlInAs-GaInAs epitaxial material system are…”
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11
Low-temperature, high-current lifetests on InP-based HBT's
Published in 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) (2001)“…Accelerated lifetests have been conducted on AlInAs-GaInAs HBT devices on InP wafers. Current densities were relatively high, while junction temperatures were…”
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12
Applications of Si/SiGe technology for high-speed communications systems
Published in 1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282) (1999)“…This paper will summarize recent developments in the field of Si/SiGe HBT technology for high-speed communications applications. This technology promises to…”
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13
GaN double heterojunction field effect transistor for microwave and millimeterwave power applications
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)“…We report development of a novel AlGaN/GaN/AlGaN double heterojunction field effect tansistor (DHFET) with improved device performance over the conventional…”
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14
V-band high-efficiency high-power AlInAs/GaInAs/InP HEMT's
Published in IEEE transactions on microwave theory and techniques (01-12-1993)“…The authors report on the state-of-the-art power performance of InP-based HEMTs (high electron mobility transistors) at 59 GHz. Using a 448- mu m-wide HEMT…”
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15
High-power V-band AlInAs/GaInAs on InP HEMTs
Published in IEEE electron device letters (01-04-1993)“…The DC and RF performance of delta -doped channel AlInAs/GaInAs on InP power high-electron-mobility transistors (HEMTs) are reported. A 450- mu m-wide device…”
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16
Q- and E-band cryogenically-coolable amplifiers using AlInAs/GaInAs/InP HEMTs
Published in Proceedings of 1995 IEEE MTT-S International Microwave Symposium (1995)“…Design, construction and performance of several cryogenically-coolable millimeter-wave amplifiers for radio astronomy applications, using AlInAs/GaInAs/InP…”
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17
Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process
Published in GaAs Reliability 2002 Workshop (2002)“…A reliability study has been conducted on capacitors made with 100 nm of silicon nitride, in an InP HEMT MMIC fabrication process. Special wafers were…”
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18
An ultrahigh-speed GaAs MESFET operational amplifier
Published in IEEE journal of solid-state circuits (01-12-1989)“…A wide-bandwidth GaAs MESFET operational amplifier is reported, with a 65-dB DC gain and a 20-GHz gain-bandwidth product at 500 MHz. The circuit uses a variety…”
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19
Correlation of frequency hopped VCO phase settling to varactor transient capacitance
Published in Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the IEEE International Frequency Control Symposium (Cat. No.99CH36313) (1999)“…Microwave VCO and system designers should be aware that attoFarad level changes in the dynamic performance of a varactor can correlate to changes in system…”
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20
Very-low-temperature lifetests on InP-based HBTs-an update
Published in GaAs Reliability 2002 Workshop (2002)“…Summary form only given. It has been pointed out by Henderson (1996) and others that HBTs are vulnerable to recombination-enhanced defect reactions (REDRs),…”
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