Search Results - "Degalahal, V.S."
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Modeling Soft Errors at the Device and Logic Levels for Combinational Circuits
Published in IEEE transactions on dependable and secure computing (01-07-2009)“…Radiation-induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has…”
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Journal Article -
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Compiler-Directed Code Restructuring for Operating with Compressed Arrays
Published in 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) (01-01-2007)“…Memory system utilization is an important issue for many embedded systems that operate under tight memory limitations. This is a strong motivation for recent…”
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Conference Proceeding